Impact of thickness variation on structural, dielectric and piezoelectric properties of (Ba, Ca) (Ti, Zr)O3 epitaxial thin films

被引：28

作者：

Ion, Valentin ^{[1
]}

Craciun, Floriana ^{[2
]}

Scarisoreanu, Nicu D. ^{[1
]}

Moldovan, Antoniu ^{[1
]}

Andrei, Andreea ^{[1
]}

Birjega, Ruxandra ^{[1
]}

Ghica, Corneliu ^{[3
]}

Di Pietrantonio, Fabio ^{[4
]}

Cannata, Domenico ^{[4
]}

Benetti, Massimiliano ^{[4
]}

Dinescu, Maria ^{[1
]}

机构：

[1] Natl Inst Laser Plasma & Radiat Phys, 409 Atomistilor, Magurele 077125, Romania

[2] CNR, ISC, Area Ric Roma Tor Vergata, Via Fosso del Cavaliere 100, I-00133 Rome, Italy

[3] Natl Inst Mat Phys, 105 BisAtomistilor, Magurele 077125, Romania

[4] CNR, IMM, Via Fosso del Cavaliere 100, I-00133 Rome, Italy

来源：

SCIENTIFIC REPORTS | 2018年 / 8卷

关键词：

BEHAVIOR;

D O I：

10.1038/s41598-018-20149-y

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

It is shown that the dielectric and piezoelectric properties of Ba(Ti0.8Zr0.2)O-3-x(Ba0.7Ca0.3)TiO3 (x = 0.45) (BCTZ 45) epitaxial thin films have a nontrivial dependence on film thickness. BCTZ 45 epitaxial films with different thicknesses (up to 400 nm) have been deposited on SrTiO3 by pulsed laser deposition and investigated by different combined techniques: conventional and off-axis X-ray diffraction, high resolution transmission electron microscopy and dielectric and piezoforce microscopy. The changes occurring in epitaxial films when their thickness increases have been attributed to a partial relaxation of misfit strain, driving the induced tetragonal symmetry in very thin films to the original rhombohedral symmetry of the bulk material in the thickest film, which influences directly and indirectly the dielectric and piezoelectric properties.

引用

页数：9

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