Analysis of Safety-Critical Computer Failures in Medical Devices

被引：84

作者：

Alemzadeh, Homa ^{[1
]}

Iyer, Ravishankar K. ^{[1
]}

Kalbarczyk, Zbigniew ^{[1
]}

Raman, Jai ^{[2
,3
]}

机构：

[1] Univ Illinois, Urbana, IL USA

[2] Rush Univ, Med Ctr, Sect Adult Cardiac Surg, Chicago, IL 60612 USA

[3] Rush Univ, Med Ctr, Adv Heart Failure Heart Transplant & Mech Circula, Chicago, IL 60612 USA

来源：

IEEE SECURITY & PRIVACY | 2013年 / 11卷 / 04期

基金：

美国国家科学基金会;

关键词：

failure analysis; FDA; FDA adverse events; FDA recalls; Food and Drug Administration; MAUDE database; medical devices; safety;

D O I：

10.1109/MSP.2013.49

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

Malfunctioning medical devices are one of the leading causes of serious injury and death in the US. Analysis of human-written descriptions of recalls and adverse event reports reveals safety issues in these devices and provides insights on the future challenges in the design of safety-critical devices.

引用

页码：14 / 26

页数：13

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