An identification method for spindle rotation error of a diamond turning machine based on the wavelet transform

被引:6
作者
Chen, Dongju [1 ]
Fan, Jinwei [1 ]
Zhang, Feihu [2 ]
机构
[1] Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
[2] Harbin Inst Technol, Dept Mech Engn, Ctr Precis Engn, Harbin 150001, Peoples R China
基金
中国国家自然科学基金;
关键词
Spindle rotation error; Error identification; Weierstrass function; Wavelet transform; PSD; WEIERSTRASS PROFILE; ELASTIC CONTACT; MOTION;
D O I
10.1007/s00170-012-3923-8
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents an identification method for the spindle rotation error from the flatness error in the workpiece surface. The spindle rotation error is identified by the wavelet transform, Weierstrass function, and power spectral density (PSD). The flatness error comprises various errors of the machine tool, such as spindle rotation error, guideway error, motor error, and ball screw error, therefore, wavelet transform is used to process the measured result of the workpiece and the signal is decomposed into high-frequency and low-frequency signal. Weierstrass function is used to fit the spindle rotation error. According to the PSD analysis of the processed signal in the frequency domain, the spindle rotation error is identified from the measured flatness error, this method provides a basis for the identification of machine tool errors.
引用
收藏
页码:457 / 464
页数:8
相关论文
共 26 条
[1]  
[Anonymous], 1985, B8934M ANSIASME
[2]  
*ANSI ASME, 2004, B8934M ANSIASME
[3]  
Bryan J.B., 1967, AM MACH, V612, P149
[4]   A method for evaluating spindle rotation errors of machine tools using a laser interferometer [J].
Castro, H. F. F. .
MEASUREMENT, 2008, 41 (05) :526-537
[5]   Elastic contact stiffness and contact resistance for the Weierstrass profile [J].
Ciavarella, M ;
Murolo, G ;
Demelio, G ;
Barber, JR .
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 2004, 52 (06) :1247-1265
[6]   Linear elastic contact of the Weierstrass profile [J].
Ciavarella, M ;
Demelio, G ;
Barber, JR ;
Jang, YH .
PROCEEDINGS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2000, 456 (1994) :387-405
[7]   ORTHONORMAL BASES OF COMPACTLY SUPPORTED WAVELETS [J].
DAUBECHIES, I .
COMMUNICATIONS ON PURE AND APPLIED MATHEMATICS, 1988, 41 (07) :909-996
[8]  
Donaldson R.R., 1972, CIRP ANN-MANUF TECHN, V21, P125
[9]  
Evans C., 1996, CIRP ANN-MANUF TECHN, V45, P617, DOI DOI 10.1016/S0007-8506(07)60515-0
[10]   Precision measurement of multi-degree-of-freedom spindle errors using two-dimensional slope sensors [J].
Gao, W ;
Kiyono, S ;
Satoh, E .
CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2002, 51 (01) :447-450