Bayesian approach to optimal release policy of software system

被引:2
|
作者
Kim, H
Yamada, S
Park, D [1 ]
机构
[1] Chosun Univ, Sch Aerosp & Naval Architecture, Kwangju 501759, South Korea
[2] Tottori Univ, Fac Engn, Dept Social Syst Engn, Tottori 6808552, Japan
[3] Hallym Univ, Dept Informat & Stat, Chunchon 200702, South Korea
关键词
NHPP; software reliability growth model; optimal release policy; Bayesian approach;
D O I
10.1093/ietfec/e88-a.12.3618
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we propose a new software reliability growth model which is the mixture of two exponential reliability growth models, one of which has the reliability growth and the other one does not have the reliability growth after the software is released upon completion of testing phase. The mixture of two such models is characterized by a weighted factor p, which is the proportion of reliability growth part within the model. Firstly, this paper discusses an optimal software release problem with regard to the expected total software cost incurred during the warranty period under the proposed software reliability growth model, which generalizes Kimura, Toyota and Yamada's (1999) model with consideration of the weighted factor. The second main purpose of this paper is to apply the Bayesian approach to the optimal software release policy by assuming the prior distributions for the unknown parameters contained in the proposed software reliability growth model. Some numerical examples are presented for the purpose of comparing the optimal software release policies depending on the choice of parameters by the non-Bayesian and Bayesian methods.
引用
收藏
页码:3618 / 3626
页数:9
相关论文
共 50 条
  • [21] Bayesian approach for adaptive sequential preventive maintenance policy
    Kim, Hee Soo
    Kwon, Young Sub
    Park, Dong Ho
    Eleventh ISSAT International Conference Reliability and Quality in Design, Proceedings, 2005, : 290 - 294
  • [22] An Ideal Software Release Policy for an Improved Software Reliability Growth Model Incorporating Imperfect Debugging with Fault Removal Efficiency and Change Point
    Chatterjee, Subhashis
    Shukla, Ankur
    ASIA-PACIFIC JOURNAL OF OPERATIONAL RESEARCH, 2017, 34 (03)
  • [23] Risk-based software release policy under parameter uncertainty
    Xie, M.
    Li, X.
    Ng, S. H.
    PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART O-JOURNAL OF RISK AND RELIABILITY, 2011, 225 (O1) : 42 - 49
  • [24] Analysis of Fuzzy Software Reliability Growth Model and Optimal Release Policy with Log-logistic Testing Effort under Imperfect Debugging
    Rani, Seema
    Ahmad, Nesar
    INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND NETWORK SECURITY, 2019, 19 (07): : 185 - 195
  • [25] On the effect of fault removal in software testing - Bayesian reliability estimation approach
    Okamura, Hiroyuki
    Furumura, Hitoshi
    Dohi, Tadashi
    ISSRE 2006:17TH INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING, PROCEEDINGS, 2006, : 247 - +
  • [26] Optimal release time determination via fuzzy goal programming approach for SDE-based software reliability growth model
    Chatterjee, S.
    Chaudhuri, Bhagyashree
    Bhar, Chandan
    SOFT COMPUTING, 2021, 25 (05) : 3545 - 3564
  • [27] Optimal release time determination via fuzzy goal programming approach for SDE-based software reliability growth model
    S. Chatterjee
    Bhagyashree Chaudhuri
    Chandan Bhar
    Soft Computing, 2021, 25 : 3545 - 3564
  • [28] Assessment of the system degradation level using the Bayesian approach
    Zutautaite-Seputiene, I.
    Augutis, J.
    Uspuras, E.
    RISK ANALYSIS VII: SIMULATION AND HAZARD MITIGATION & BROWNFIELDS V: PREVENTION, ASSESSMENT, REHABILITATION AND DEVELOPMENT OF BROWNFIELD SITES, 2010, : PI47 - PI57
  • [29] Geometrical solution methods for an optimal software release problem using artificial neural networks
    Dohi, T
    Nishio, Y
    Shinohara, Y
    Osaki, S
    ELECTRONICS AND COMMUNICATIONS IN JAPAN PART III-FUNDAMENTAL ELECTRONIC SCIENCE, 2000, 83 (08): : 10 - 18
  • [30] Interval Estimations of Software Reliability and Optimal Release Time Based on Better Bootstrap Confidence Intervals
    Inoue, Shinji
    Yamada, Shigeru
    2013 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT (IEEM 2013), 2013, : 467 - 471