Kelvin Probe Force Microscopy in Nonpolar Liquids

被引:32
|
作者
Domanski, Anna L. [1 ]
Sengupta, Esha [1 ]
Bley, Karina [1 ]
Untch, Maria B. [1 ]
Weber, Stefan A. L. [1 ]
Landfester, Katharina [1 ]
Weiss, Clemens K. [1 ]
Butt, Hans-Juergen [1 ]
Berger, Ruediger [1 ]
机构
[1] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
关键词
SELF-ASSEMBLED MONOLAYERS; WORK-FUNCTION; METAL-SURFACES; FILMS; GOLD; ALKANETHIOLS; ADSORPTION; INTERFACE; LAYER;
D O I
10.1021/la302451h
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Work function changes of Au were measured by Kelvin probe force microscopy (KPFM) in the nonpolar liquid decane. As a proof of principle for the measurement in liquids, we investigated the work function change of an Au substrate upon hexadecanethiol chemisorption. To relate the measured contact potential difference (CPD) during the chemisorption of alkanethiols to a change of the work function, the influence of physisorbed decane must be taken into account. It is crucial that either the work function of the scanning probe microscope (SPM) tip or the sample surface remains constant throughout the reaction, since both contribute to the CPD. We describe two routes for determining the work function shift of Au coated with a monolayer of alkanethiols: In the first route, the SPM tips were taken as reference surfaces (constant tip work function). For this approach, we used Au(111) surfaces and kept the SPM tip ex situ during the adsorption process. In the second route, structured surfaces with reactive and inert parts were studied by KPFM (constant reference work function). For this route, we prepared nanometer sized Au structures by nanosphere lithography on SiOx substrates. Now, the SiOx served as the inert reference surface. The shifts in the work function after exposure to the hexadecanethiol (HDT) solution were determined to be Delta Phi(Au+HDT,decane-Au,air) = -1.33 eV +/- 0.07 eV (route I) and Delta Phi(Au+HDT,decane-Au,air) = -1.46 eV +/- 0.04 eV (route II). Both values are in excellent agreement with the work function shifts determined by ultraviolet photoemission spectroscopy (UPS) reported in literature. The presented procedures of measuring work function changes in decane open new ways to study local reactions at solid liquid interfaces.
引用
收藏
页码:13892 / 13899
页数:8
相关论文
共 50 条
  • [21] Signal amplitude and sensitivity of the Kelvin probe force microscopy
    Ouisse, T
    Martins, F
    Stark, M
    Huant, S
    Chevrier, J
    APPLIED PHYSICS LETTERS, 2006, 88 (04) : 1 - 3
  • [22] The influence of surface topography on Kelvin probe force microscopy
    Sadewasser, S.
    Leendertz, C.
    Streicher, F.
    Lux-Steiner, M. Ch
    NANOTECHNOLOGY, 2009, 20 (50)
  • [23] Dual-heterodyne Kelvin probe force microscopy
    Grévin B.
    Husainy F.
    Aldakov D.
    Aumaître C.
    Beilstein Journal of Nanotechnology, 2023, 14 : 1068 - 1084
  • [24] The effect of sample resistivity on Kelvin probe force microscopy
    Weymouth, A. J.
    Giessibl, F. J.
    APPLIED PHYSICS LETTERS, 2012, 101 (21)
  • [25] Kelvin probe force microscopy for perovskite solar cells
    Kang, Zhuo
    Si, Haonan
    Shi, Mingyue
    Xu, Chenzhe
    Fan, Wenqiang
    Ma, Shuangfei
    Kausar, Ammarah
    Liao, Qingliang
    Zhang, Zheng
    Zhang, Yue
    SCIENCE CHINA-MATERIALS, 2019, 62 (06) : 776 - 789
  • [26] Three-Dimensional Kelvin Probe Force Microscopy
    Geng, Junyuan
    Zhang, Hao
    Meng, Xianghe
    Gao, Haibo
    Rong, Weibin
    Xie, Hui
    ACS APPLIED MATERIALS & INTERFACES, 2022, 14 (28) : 32719 - 32728
  • [27] Atomic and Kelvin probe force microscopy of thin films
    Alessandrini, A
    Valdrè, U
    PROCEEDINGS OF THE 5TH MULTINATIONAL CONGRESS ON ELECTRON MICROSCOPY, 2001, : 553 - 554
  • [28] Dual-heterodyne Kelvin probe force microscopy
    Grevin, Benjamin
    Husainy, Fatima
    Aldakov, Dmitry
    Aumaitre, Cyril
    BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2023, 14 : 1068 - 1084
  • [29] Space Charge Measurements with Kelvin Probe Force Microscopy
    Faliya, Kapil
    Kliem, Herbert
    Dias, Carlos J.
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2017, 24 (03) : 1913 - 1922
  • [30] Kelvin probe force microscopy of semiconductor surface defects
    Rosenwaks, Y
    Shikler, R
    Glatzel, T
    Sadewasser, S
    PHYSICAL REVIEW B, 2004, 70 (08) : 085320 - 1