Investigation of orientation gradients around a hard Laves particle in a warm-rolled Fe3Al-based alloy using a 3D EBSD-FIB technique

被引:144
作者
Konrad, J [1 ]
Zaefferer, S [1 ]
Raabe, D [1 ]
机构
[1] Max Planck Inst Eisenforsch GmbH, Abt Mikrostrukturphys & Umformtech, D-40237 Dusseldorf, Germany
关键词
EBSD; lattice rotation; orientation gradient; iron-aluminium; texture;
D O I
10.1016/j.actamat.2005.11.015
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present a study of the microstructure around a hard Laves particle in a warm-rolled intermetallic Fe3Al-based alloy. The experiments are conducted using a system for three-dimensional orientation microscopy (3D electron backscattering diffraction, EBSD). The approach is realized by a combination of a focused ion beam (FIB) unit for serial sectioning with high-resolution field emission scanning electron microscopy with EBSD. We observe the formation of steep 3D orientation gradients in the Fe3Al matrix around the rigid precipitate which entail in part particle-stimulated nucleation events in the immediate vicinity of the particle. The orientation gradients assume a characteristic pattern around the particle in the transverse plane while revealing an elongated tubular morphology in the rolling direction. However, they do not reveal a characteristic common rotation axis. Recovered areas in the matrix appear both in the transverse and rolling directions around the particle. The work demonstrates that the new 3D EBSD-FIB technique provides a new level of microstructure information that cannot be achieved by conventional 2D-EBSD analysis. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:1369 / 1380
页数:12
相关论文
共 59 条
  • [1] ORIENTATION IMAGING - THE EMERGENCE OF A NEW MICROSCOPY
    ADAMS, BL
    WRIGHT, SI
    KUNZE, K
    [J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1993, 24 (04): : 819 - 831
  • [2] [Anonymous], 1995, P 16 RIS INT S MAT S
  • [3] BARRETT LK, 1967, T METALL SOC AIME, V239, P1172
  • [4] Development of ion and electron dual focused beam apparatus for high spatial resolution three-dimensional microanalysis of solid materials
    Cheng, Z
    Sakamoto, T
    Takahashi, M
    Kuramoto, Y
    Owari, M
    Nihei, Y
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04): : 2473 - 2478
  • [5] MICROTEXTURE DETERMINATION BY ELECTRON BACK-SCATTER DIFFRACTION
    DINGLEY, DJ
    RANDLE, V
    [J]. JOURNAL OF MATERIALS SCIENCE, 1992, 27 (17) : 4545 - 4566
  • [6] THERMIONIC EMISSION MICROSCOPE STUDY OF FORMATION OF FERRITE SIDEPLATES
    EICHEN, E
    POUND, GM
    AARSONSO.HI
    TRIVEDI, R
    [J]. ACTA METALLURGICA, 1964, 12 (11): : 1298 - &
  • [7] The deformation and recrystallization of particle-containing {011}[100]aluminium crystals
    Ferry, M
    Humphreys, FJ
    [J]. ACTA MATERIALIA, 1996, 44 (08) : 3089 - 3103
  • [8] FERRY M, 1996, P REX 96 3 INT C REC, P323
  • [9] A review of focused ion beam milling techniques for TEM specimen preparation
    Giannuzzi, LA
    Stevie, FA
    [J]. MICRON, 1999, 30 (03) : 197 - 204
  • [10] GROEBER M, 2004, P NUMIFORM 2004 AIP, P1712