X-ray Compton backscattering techniques for process tomography: Imaging and characterization of materials

被引:19
作者
Zhu, P
Duvauchelle, P
Peix, G
Babot, D
机构
[1] INSA-Lyon, Laboratoire CNDRI, Bâtiment 303, 69621 Villeurbanne Cedex
关键词
D O I
10.1088/0957-0233/7/3/008
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Non-destructive evaluation by Compton scattering using an industrial x-ray tube allows three-dimensional (3D) imaging of materials. The x-ray tube and the detector are set on the same side of the object. Thus, non-destructive evaluation of the wall of a tank, even when it is full, is possible without the requirement for the x-ray beam to cross the whole object. Several applications were tried in our laboratory. Besides 3D imaging, a method allowing thickness measurement of a wall was developed, which was especially suitable for multilayer compounds. The accuracy is +/-0.01 mm. Compton scattering techniques also allow point-by-point density measurements in the near-surface zone of any component (even dense and bulky ones). An accuracy of 1% was achieved for light composite materials and also for dense components (p approximate to 6.5) provided by powder metallurgy. A new application allows us to perform 3D imaging using a linear accelerator (6 MeV) as the photon source. Thus, testing can be performed inside a tank, even through a thick and dense wall (8 mm of steel).
引用
收藏
页码:281 / 286
页数:6
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