1550-nm time-of-flight ranging system employing laser with multiple repetition rates for reducing the range ambiguity

被引:73
作者
Liang, Yan [1 ]
Huang, Jianhua [1 ]
Ren, Min [1 ]
Feng, Baicheng [1 ]
Chen, Xiuliang [1 ]
Wu, E. [1 ]
Wu, Guang [1 ]
Zeng, Heping [1 ,2 ]
机构
[1] E China Normal Univ, State Key Lab Precis Spect, Shanghai 200062, Peoples R China
[2] Shanghai Univ Sci & Technol, Shanghai Key Lab Modern Opt Syst, Engn Res Ctr Opt Instrument & Syst, Minist Educ,Sch Opt Elect & Comp Engn, Shanghai 200093, Peoples R China
基金
上海市自然科学基金;
关键词
SINGLE-PHOTON DETECTION; AVALANCHE PHOTODIODE; NM WAVELENGTH; DETECTOR;
D O I
10.1364/OE.22.004662
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We demonstrated a time-of-flight (TOF) ranging system employing laser pulses at 1550 nm with multiple repetition rates to decrease the range ambiguity, which was usually found in high-repetition TOF systems. The time-correlated single-photon counting technique with an InGaAs/InP avalanche photodiode based single-photon detector, was applied to record different arrival time of the scattered return photons from the non-cooperative target at different repetition rates to determine the measured distance, providing an effective and convenient method to increase the absolute range capacity of the whole system. We attained hundreds of meters range with millimeter accuracy by using laser pulses of approximately 10-MHz repetition rates. (C) 2014 Optical Society of America
引用
收藏
页码:4662 / 4670
页数:9
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