Imaging, microscopic analysis, and modeling of a CdTe module degraded by heat and light

被引：12

作者：

Johnston, Steve ^{[1
]}

Albin, David ^{[1
]}

Hacke, Peter ^{[1
]}

Harvey, Steven P. ^{[1
]}

Moutinho, Helio ^{[1
]}

Jiang, Chun-Sheng ^{[1
]}

Xiao, Chuanxiao ^{[1
]}

Parikh, Anuja ^{[2
]}

Nardone, Marco ^{[2
]}

Al-Jassim, Mowafak ^{[1
]}

Metzger, Wyatt K. ^{[1
]}

机构：

[1] Natl Renewable Energy Lab, Golden, CO 80401 USA

[2] Bowling Green State Univ, Bowling Green, OH 43403 USA

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2018年 / 178卷

关键词：

Accelerated aging; Cadmium telluride; Imaging; microscopy; Modeling; Photoluminescence; SOLAR-CELLS; THIN-FILMS; DIFFUSION; CU;

D O I：

10.1016/j.solmat.2017.12.021

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Photoluminescence (PL), electroluminescence (EL), and dark lock-in thermography are collected during stressing of a CdTe module under one-Sun light at an elevated temperature of 100 degrees C. The PL imaging system is simple and economical. The PL images show differing degrees of degradation across the module and are less sensitive to effects of shunting and resistance that appear on the EL images. Regions of varying degradation are chosen based on avoiding pre-existing shunt defects. These regions are evaluated using time-of-flight secondary ion-mass spectrometry and Kelvin probe force microscopy. Reduced PL intensity correlates to increased Cu concentration at the front interface. Numerical modeling and measurements agree that the increased Cu concentration at the junction also correlates to a reduced space charge region.

引用

页码：46 / 51

页数：6

共 19 条

[1] Copper inclusion and migration from the back contact in CdTe solar cells [J].