Electron emission contributions to dark current and its relation to microscopic field enhancement and heating in accelerator structures

被引:65
作者
Jensen, Kevin L. [1 ]
Lau, Y. Y. [2 ]
Feldman, D. W. [3 ]
O'Shea, P. G. [3 ]
机构
[1] USN, Res Lab, Washington, DC 20375 USA
[2] Univ Michigan, Ann Arbor, MI 48109 USA
[3] Univ Maryland, College Pk, MD 20742 USA
关键词
D O I
10.1103/PhysRevSTAB.11.081001
中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
Analytically tractable models of thermal-field emission, field enhancement, and heating mechanisms ( Nottingham and resistive) are developed and combined to make estimates of the fields and temperatures that accompany the development and growth of asperities. The relation of asperity dimensions to dark current is discussed in two experimentally motivated examples. The hypothetical relation of microscopic sources of dark current and heating to breakdown is discussed in the context of Nottingham and resistive heating. The latter are estimated using a general thermal-field methodology. A point-charge model is used to find field enhancement factors. Last, a thermal model is used to estimate the temperature dependence of the resistivity and thermal conductivity. Together, these models suggest that conditions can arise in which the temperature at the apex of an asperity can experience growth and contribute to melting or fracture (or both), and that Nottingham heating generally dominates the resistive heating term.
引用
收藏
页数:17
相关论文
共 75 条
[1]   DENSITY-GRADIENT ANALYSIS OF FIELD-EMISSION FROM METALS [J].
ANCONA, MG .
PHYSICAL REVIEW B, 1992, 46 (08) :4874-4883
[2]   Thermomechanical analysis of failure of metal field emitters [J].
Ancona, MG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06) :2206-2214
[3]   ACTIVATION ENERGY FOR THE SURFACE MIGRATION OF TUNGSTEN IN THE PRESENCE OF A HIGH-ELECTRIC FIELD [J].
BETTLER, PC ;
CHARBONNIER, FM .
PHYSICAL REVIEW, 1960, 119 (01) :85-93
[4]   FIELD-EMISSION AND SURFACE CONDITIONING [J].
BONIN, B .
VACUUM, 1995, 46 (8-10) :907-912
[5]  
BONIN B, 1995, ICTP SCH NONACCELERA
[6]   Frequency and temperature dependence of electrical breakdown at 21, 30, and 39 GHz -: art. no. 224801 [J].
Braun, HH ;
Döbert, S ;
Wilson, I ;
Wuensch, W .
PHYSICAL REVIEW LETTERS, 2003, 90 (22) :4
[7]  
CAHAY M, 2002, NOISE FLUCTUATIONS C
[8]   Arcing and voltage breakdown in vacuum microelectronics microwave devices using field emitter arrays: Causes, possible solutions, and recent progress [J].
Charbonnier, F .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (02) :880-887
[9]   ELECTRICAL BREAKDOWN BETWEEN METAL ELECTRODES IN HIGH VACUUM .I. THEORY [J].
CHARBONNIER, FM ;
BENNETTE, CJ ;
SWANSON, LW .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (02) :627-+
[10]   NOTTINGHAM EFFECT IN FIELD + T-F EMISSION - HEATING + COOLING DOMAINS + INVERSION TEMPERATURE [J].
CHARBONNIER, FM ;
STRAYER, RW ;
SWANSON, LW ;
MARTIN, EE .
PHYSICAL REVIEW LETTERS, 1964, 13 (13) :397-&