Analysis of mesoscopic stress states with delamination and their relation to critical current under bending deformation in Bi2223/Ag superconducting composite tapes

被引:21
作者
Hojo, M [1 ]
Nakamura, M
Tanaka, M
Adachi, T
Sugano, M
Ochiai, S
Osamura, K
机构
[1] Kyoto Univ, Dept Mech Engn & Sci, Sakyo Ku, Kyoto 6068501, Japan
[2] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6158510, Japan
[3] Kyoto Univ, Int Innovat Ctr, Kyoto 6158510, Japan
[4] Kyoto Univ, Dept Mat Sci & Engn, Kyoto 6068501, Japan
关键词
D O I
10.1088/0953-2048/18/12/022
中图分类号
O59 [应用物理学];
学科分类号
摘要
The mesoscopic stress and strain states of Bi2223/Ag/Ag-alloy superconducting composite tapes have been studied both analytically and experimentally under bending deformation. The tapes used in the present study were supplied as the standard samples for the VAMAS round-robin program (classified as VAM1 and VAM3). Detailed tape bending analysis was completed based on a damage-free initial state, and the calculated decrease of critical current, I-c, due to Bi2223 filament fracture was compared to the experimental I-c decrease. The calculated I-c was much lower than that obtained in the experiments for both tapes. Metallography indicated the presence of delamination in as-received as well as bend-tested tapes. The analysis was therefore modified to include delamination and it was completed for the case where delamination occupied the full width of the tape mid-plane. The calculated I-c with delamination was higher than the experimental results for both tapes. Delamination occupying partial width of the mid-plane explained this difference. Finally, the width ratio where delamination exists was calculated by comparing the analytical results with delamination and experimental results. This ratio increased with increasing curvature of the tape.
引用
收藏
页码:S356 / S363
页数:8
相关论文
共 24 条
  • [1] BALACHANDRAM U, 1996, ADV CRYOGEN ENG, V42, P753
  • [2] Influence of delamination location on mesoscopic stress state and critical current under bending deformation in Bi2223/Ag superconducting composite tapes
    Hojo, M
    Nakamura, M
    Tanaka, M
    Adachi, T
    Sugano, M
    Ochiai, S
    Osamura, K
    [J]. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2005, 426 (II): : 1205 - 1210
  • [3] Microscopic fracture of filaments and its relation to the critical current under bending deformation in (Bi,Pb)2Sr2Ca2CU3O10 composite superconducting tapes
    Hojo, M
    Nakamura, M
    Matsuoka, T
    Tanaka, M
    Ochiai, S
    Sugano, M
    Osamura, K
    [J]. SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2003, 16 (09) : 1043 - 1051
  • [4] Bending deformation and its influence on critical current in Bi2223 composite superconducting tapes
    Hojo, M
    Matsuoka, T
    Nakaoka, S
    Tanaka, M
    Ochiai, S
    Sugano, M
    Osamura, K
    [J]. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2003, 392 : 1156 - 1161
  • [5] ITOH K, 2000, 38 VAMAS TWA
  • [6] Local variations in the critical current degradation of Ag/Bi2223 tape by tensile and bending strains
    Katagiri, K
    Shin, HS
    Kasaba, K
    Tsukinokizawa, T
    Hiroi, K
    Kuroda, T
    Itoh, K
    Wada, H
    [J]. SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2003, 16 (09) : 995 - 999
  • [7] Development of high performance Ag sheathed Bi2223 wire
    Kato, T
    Kobayashi, S
    Yamazaki, K
    Ohkura, K
    Ueyama, M
    Ayai, N
    Fujikami, J
    Ueno, E
    Kikuchi, M
    Hayashi, K
    Sato, K
    [J]. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2004, 412 : 1066 - 1072
  • [8] Controlled over-pressure sintering process of Bi2223 wires
    Kobayashi, S
    Yamazaki, K
    Kato, T
    Ohkura, K
    Ueno, E
    Fujino, K
    Fujikami, J
    Ayal, N
    Kikuchi, M
    Hayashi, K
    Sato, K
    Hata, R
    [J]. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2005, 426 : 1132 - 1137
  • [9] Complementary analysis of the results of a bending strain effect round robin-test on the critical currents of Ag alloy-sheathed Bi-2223 tapes
    Kuroda, T
    Itoh, K
    Kumakura, H
    Wada, H
    Katagiri, K
    [J]. SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2003, 16 (09) : 1120 - 1126
  • [10] KURODA T, 2001, P INT WORKSH MECH EL, P27