共 30 条
[1]
Characterizing nanoimprint profile shape and polymer flow behavior using visible light angular scatterometry
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2007, 25 (06)
:2396-2401
[3]
Diebold AC, 2001, HDB SILICON SEMICOND, P477
[5]
Real time scatterometry for profile control during resist trimming process
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2009, 27 (06)
:3232-3237
[6]
Gionis A, 1999, PROCEEDINGS OF THE TWENTY-FIFTH INTERNATIONAL CONFERENCE ON VERY LARGE DATA BASES, P518