A comparison of one and two-dimensional S-Transform in fringe pattern demodulation

被引:9
|
作者
Zhong, Min [1 ]
Chen, Wenjing [1 ]
Su, Xianyu [1 ]
机构
[1] Sichuan Univ, Optoelect Dept, Chengdu 610064, Peoples R China
关键词
Information processing; S-Transform; Fringe analysis; Phase retrieval; PHASE-MEASURING PROFILOMETRY; 3D SHAPE MEASUREMENT; NONLINEARITY; LOCALIZATION; PROJECTION; RETRIEVAL;
D O I
10.1016/j.optlaseng.2013.11.008
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
S-Transform, as a time-frequency analysis approach, has been successfully introduced into fringe pattern demodulation in recent years. The paper presents a thorough discussion on the application of this technique in analyzing fringe pattern. A brief review of the S transform profilometry is followed by the comparison between the one-dimensional S-Transform method and the two-dimensional S-Transform method, including one-dimensional S-Transform ridge method, one-dimensional S-Transform filtering method, two-dimensional S-Transform ridge method and two-dimensional S-Transform filtering method in the application of the phase retrieval from the fringe patterns with different noise, contrast, nonlinearity and fringe breaking. Numerical computer simulations and experiments were carried out to show the 1DST method is sensitive to the noise but suitable to detect detail of the measured object, while 2DST method with capability of smooth processing for the surface of the measured object is adapt to demodulate the fringe pattern with serious noise. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:212 / 220
页数:9
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