Electrical Characteristics and Microstructures of Pr6O11-doped Bi4Ti3O12 Ceramics

被引:0
作者
Chen, M. [1 ]
Mei, X. A. [1 ]
Liu, R. F. [1 ]
Huang, C. Q. [1 ]
Liu, J. [1 ]
机构
[1] Hunan Inst Sci & Technol, Sch Phys & Elect, Yueyang 414000, Peoples R China
来源
HIGH-PERFORMANCE CERAMICS VII, PTS 1 AND 2 | 2012年 / 512-515卷
关键词
Microstructure; Impedance; Electrical properties; Bismuth titanate; THIN-FILMS; BISMUTH TITANATE; CAPACITORS; MEMORIES;
D O I
10.4028/www.scientific.net/KEM.512-515.1313
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The electrical properties of Pr6O11-doped bismuth titanates (BixPryTi3O12,2, BPT) ceramics prepared by a conventional ceramic technique have been investigated. At applied d.c. field below 200V/mm, the current-voltage curve of Pr-doped samples exhibit negative differential resistance behavior. The conducting filamentary model has been used to explain the negative differential resistance phenomenon in Pr-doped bismuth titanates. The impedance spectrum indicates that Pr-doped sample consists of semiconducting grain and moderately insulating grain boundary regions. XRD, SEM and EPMA analyses reveal crystalline phase characterized by a Bi-layered perovskite structure of Bi4Ti3O12 and the distribution of every element is uniform. Pr-doped samples exhibit randomly oriented and plate-like morphology.
引用
收藏
页码:1313 / 1316
页数:4
相关论文
共 12 条
  • [11] Dielectric characterization of Bi3.25La0.75Ti3O12 thin films
    Wu, D
    Li, AD
    Ming, NB
    [J]. APPLIED PHYSICS LETTERS, 2004, 84 (22) : 4505 - 4507
  • [12] Preparation and electrical properties of Bi3.25Pr0.75Ti3O12 ferroelectric thin films
    Wu, D
    Li, AD
    Yu, T
    Ming, NB
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2004, 78 (01): : 95 - 99