共 50 条
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- [2] Exploiting Behavioral Information in Gate-Level ATPG Journal of Electronic Testing, 1999, 14 : 141 - 148
- [3] Improving gate-level ATPG by traversing concurrent EFSMs 24TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2006, : 172 - +
- [4] Improving ATPG gate-level fault coverage by using test vectors generated from behavioral HDL descriptions IFIP VLSI-SOC 2006: IFIP WG 10.5 INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION & SYSTEM-ON-CHIP, 2006, : 314 - +
- [5] Guided Gate-level ATPG for Sequential Circuits using a High-level Test Generation Approach 2010 15TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC 2010), 2010, : 420 - 425
- [8] Modular test generation and concurrent transparency-based test translation using gate-level ATPG PROCEEDINGS OF THE IEEE 2000 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2000, : 75 - 78