Galvanic Corrosion in Metal-Matrix Composites Containing Semiconducting Constituents

被引：6

作者：

Ding, Hongbo ^{[1
]}

Hihara, L. H. ^{[1
]}

机构：

[1] Univ Hawaii Manoa, Dept Mech Engn, Hawaii Corros Lab, Honolulu, HI 96822 USA

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 2009年 / 156卷 / 12期

关键词：

SILICON-CARBIDE;

D O I：

10.1149/1.3232299

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

A modified photochemical-diode (PD) model, designated as a photochemical-corrosion-diode (PCD) model, was proposed for interpreting galvanic corrosion in metal-matrix composites (MMCs) containing semiconducting constituents. The characteristics of the PCD model were introduced through direct comparison with that of the PD model. The PCD model was then used to interpret galvanic corrosion in SiC-reinforced Al MMCs. The PCD model and the photoelectrochemical experiments on both Al/SiC MMCs and monolithic SiC predicted that solar irradiation may affect the corrosion of the Al/SiC MMCs, corroborating well with field experiments. (C) 2009 The Electrochemical Society. [DOI: 10.1149/1.3232299] All rights reserved.

引用

页码：C422 / C427

页数：6

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