Control of grain position in Ni-mediated crystallization of amorphous silicon

被引:6
作者
Park, Seong Jin [1 ]
Kim, Kyung Ho [1 ]
Jang, Jin [1 ]
机构
[1] Kyung Hee Univ, Adv Display Res Ctr, Seoul 130701, South Korea
关键词
recrystallization; metal-induced crystallization; sold phase epitaxy; polycrystalline silicon; semiconducting silicon; field effect transitors; solar cells;
D O I
10.1016/j.jcrysgro.2006.10.158
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We report the control of nucleation sites for Ni-mediated crystallization of a-Si. It was shown that the self-organization of Ni atoms at the pressure-induced indentation sites on a-Si can be possible during thermal annealing without selective Ni contact or patterning. We have succeeded in forming Ni segregation sites (SSs) on a-Si by pressing a SiO2 coated steel tip-array, where the nucleation starts. Any mechanical damage, such as peeling off and crack, was not found in the a-Si by atomic force microscope (AFM) inspection, when the tip-pressing pressures are in the range of 31-94 MPa. By controlling nucleation sites, the poly-Si with well-aligned rectangular grains of 20 mu m x 40 mu m have been achieved for the first time. (c)\ 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:382 / 386
页数:5
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