The formation of β-FeSi2 precipitates in microcrystalline Si

被引:3
作者
Terukov, EI [1 ]
Kon'kov, OI [1 ]
Kudoyarova, VK [1 ]
Gusev, OB [1 ]
Davydov, VY [1 ]
Mosina, GN [1 ]
机构
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
关键词
D O I
10.1134/1.1521222
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The formation of beta-FeSi2 precipitates was observed for the first time in microcrystalline Si films. The Fe-doped amorphous Si films (a-Si:Fe) were obtained using magnetron sputtering. Subsequent short-time thermal treatment led to the transition of amorphous Si to microcrystalline Si and to the formation of beta-FeSi2 precipitates. The samples synthesized emitted at the wavelength lambda approximate to 1.54 mum at 100 K. (C) 2002 MAIK "Nauka / Interperiodica".
引用
收藏
页码:1235 / 1239
页数:5
相关论文
共 12 条
[1]  
[Anonymous], 1989, JCPDS POWD DIFFR FIL
[2]   Pulsed ion-beam synthesis of β-FeSi2 precipitate layers in Si(100) [J].
Batalov, RI ;
Bayazitov, RM ;
Khaibullin, IB ;
Terukov, EI ;
Kudoyarova, VK .
NANOTECHNOLOGY, 2001, 12 (04) :409-412
[3]   A pulsed synthesis of β-FeSi2 layers on silicon implanted with Fe+ ions [J].
Batalov, RI ;
Bayazitov, RM ;
Terukov, EI ;
Kudoyarova, VK ;
Weiser, G ;
Kuehne, H .
SEMICONDUCTORS, 2001, 35 (11) :1263-1269
[4]   Raman investigation of ion beam synthesized β-FeSi2 [J].
Birdwell, AG ;
Glosser, R ;
Leong, DN ;
Homewood, KP .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (02) :965-972
[5]   OPTICAL-PROPERTIES OF SEMICONDUCTING IRON DISILICIDE THIN-FILMS [J].
BOST, MC ;
MAHAN, JE .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (07) :2696-2703
[6]  
DROZDOV NA, 1976, JETP LETT+, V23, P597
[7]  
Kolbesen BO, 2000, PHYS STATUS SOLIDI B, V222, P303, DOI 10.1002/1521-3951(200011)222:1<303::AID-PSSB303>3.0.CO
[8]  
2-H
[9]   OPTICAL AND ELECTRICAL CHARACTERIZATION OF BETA-FESI2 EPITAXIAL THIN-FILMS ON SILICON SUBSTRATES [J].
LEFKI, K ;
MURET, P ;
CHERIEF, N ;
CINTI, RC .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (01) :352-357
[10]   INFRARED AND RAMAN CHARACTERIZATION OF BETA-IRON SILICIDE [J].
LEFKI, K ;
MURET, P ;
BUSTARRET, E ;
BOUTAREK, N ;
MADAR, R ;
CHEVRIER, J ;
DERRIEN, J ;
BRUNEL, M .
SOLID STATE COMMUNICATIONS, 1991, 80 (10) :791-795