Transitions between Be acceptor levels in GaAs bulk

被引:2
作者
Zheng Wei-Min [1 ]
Huang Hai-Bei [2 ]
Li Su-Mei [3 ]
Cong Wei-Yan [1 ]
Wang Ai-Fang [1 ]
Li Bin [4 ]
Song Ying-Xin [5 ]
机构
[1] Shandong Univ Weihai, Sch Space Sci & Phys, Weihai 264209, Peoples R China
[2] Shandong Univ, Sch Chem & Chem Engn, Jinan 250100, Shandong, Peoples R China
[3] Shandong Univ Weihai, Sch Informat Engn, Weihai 264209, Peoples R China
[4] Chinese Acad Sci, Shanghai Inst Tech Phys, Shanghai 200083, Peoples R China
[5] Jinan Semicond Res Inst, Jinan 250014, Shandong, Peoples R China
基金
中国国家自然科学基金;
关键词
far-infrared absorption spectrum; Raman spectrum; photoluminescence spectrum; energy state structure of Be acceptor; P-TYPE GAAS; SHALLOW ACCEPTORS; DOPED GAAS; RAMAN-SCATTERING; DEFECT LEVELS; SPECTRA; CONFINEMENT; ABSORPTION; STATES; ENERGY;
D O I
10.7498/aps.68.20190254
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The doping is one of important means in the semiconductor manufacturing techniques, by which the optical and electric properties of semiconductor materials can be significantly improved. The doping level and energy level structure of dopants have a great influence on the operating performances of micro-electronic devices. Beryllium is one of acceptors, which is frequently used to be doped in GaAs bulk, because it is very stable with respect to diffusion at higher temperatures. Therefore, it is significant for the application to optoelectronic devices that the energy-state structure of Be acceptors in GaAs bulk can be investigated in detail. The sample GaAs:Be used in experiment is a 5-pm-thick epitaxial single layer doped uniformly by Be acceptors with a doping level of 2 x 10(16 )cm(-3), and grown by molecular beam epitaxy on 450-pm-thick semi-insulating (100) GaAs substrates in a VG V80 H reactor equipped with all solid sources. The transitions between the energy states of Be acceptors are studied experimentally by different spectroscopy techniques. The far-infrared absorption experiments are performed by using a Fourier-transform spectrometer equipped with a tungsten light source and a multilayer wide band beam splitter. Prior to the absorption spectrum measurement, the sample is thinned, polished and wedged to approximately a 5 degrees angle to suppress optical interference between the front and back faces. Then, the sample is placed into the cryostat with liquid helium (4.2 K). The photoluminescence and Raman spectra are also measured at 4.2 K by a Renishaw Raman imaging microscope. The optical excitation to the sample is provided by an argon-ion laser with a wavelength of 514.5 nm, and the excited power is typically 5 mW. The odd-parity transitions from the Be acceptor ground state 1S(3/2)Gamma(8) to three excited states, i.e. 2P(3/2)Gamma(8), 2P(5/2)Gamma(8) and 2P(5/2)Gamma 7 are clearly observed in the far-infrared absorption spectra, then the respective transition energy values are obtained, which are in excellent agreement with the experimental results reported previously. In the photoluminescence spectrum, the emission peak labelled two hole transition, originating from the twohole transition of recombination of the neutral-accptor bound excitons, is seen obviously, thus the energy of the even-parity transition between 1S(3/2)Gamma(8) and 2S(3/2)Gamma(8) states is found indirectly. Furthermore, in the Raman spectrum measured, the transition peak between 1S(3/2)Gamma(8 )and 2S(3/2)Gamma(8) states is well resolved, and the transition energy between them is gained directly. By comparison, the transition energy values gained directly and indirectly are found to be consistent with each other.
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页数:6
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共 32 条
[1]   Doping concentration dependence of the photoluminescence spectra of n-type GaAs nanowires [J].
Arab, Shermin ;
Yao, Maoqing ;
Zhou, Chongwu ;
Dapkus, P. Daniel ;
Cronin, Stephen B. .
APPLIED PHYSICS LETTERS, 2016, 108 (18)
[2]   FAR-INFRARED ZEEMAN SPECTROSCOPY OF SHALLOW C-ACCEPTORS AND ZN-ACCEPTORS IN GAAS [J].
ATZMULLER, R ;
DAHL, M ;
KRAUS, J ;
SCHAACK, G ;
SCHUBERT, J .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1991, 3 (35) :6775-6788
[3]   CUBIC CONTRIBUTIONS TO SPHERICAL MODEL OF SHALLOW ACCEPTOR STATES [J].
BALDERES.A ;
LIPARI, NO .
PHYSICAL REVIEW B, 1974, 9 (04) :1525-1539
[4]   BINDING-ENERGY OF SHALLOW ACCEPTORS IN GROUP-4 ELEMENTS AND 3-5 COMPOUNDS [J].
BALDERESCHI, A ;
LIPARI, NO .
JOURNAL OF LUMINESCENCE, 1976, 12 (01) :489-493
[5]   SPHERICAL MODEL OF SHALLOW ACCEPTOR STATES IN SEMICONDUCTORS [J].
BALDERESCHI, A ;
LIPARI, NO .
PHYSICAL REVIEW B, 1973, 8 (06) :2697-2709
[6]   Electron charge and spin delocalization revealed in the optically probed longitudinal and transverse spin dynamics in n-GaAs [J].
Belykh, V. V. ;
Kavokin, K. V. ;
Yakovlev, D. R. ;
Bayer, M. .
PHYSICAL REVIEW B, 2017, 96 (24)
[7]   TEMPERATURE-DEPENDENCE OF MINORITY-CARRIER MOBILITY AND RECOMBINATION TIME IN P-TYPE GAAS [J].
BEYZAVI, K ;
LEE, K ;
KIM, DM ;
NATHAN, MI ;
WRENNER, K ;
WRIGHT, SL .
APPLIED PHYSICS LETTERS, 1991, 58 (12) :1268-1270
[8]   IMPURITY AND DEFECT LEVELS IN BERYLLIUM-DOPED GAAS GROWN BY MOLECULAR-BEAM EPITAXY [J].
BHATTACHARYA, PK ;
BUHLMANN, HJ ;
ILEGEMS, M ;
STAEHLI, JL .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (09) :6391-6398
[9]   AN OPTICAL CHARACTERIZATION OF DEFECT LEVELS INDUCED BY MBE GROWTH OF GAAS [J].
CONTOUR, JP ;
NEU, G ;
LEROUX, M ;
CHAIX, C ;
LEVESQUE, B ;
ETIENNE, P .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (03) :811-815
[10]   UNIFORM-CARRIER-CONCENTRATION PARA-TYPE LAYERS IN GAAS PRODUCED BY BERYLLIUM ION-IMPLANTATION [J].
DONNELLY, JP ;
LEONBERGER, FJ ;
BOZLER, CO .
APPLIED PHYSICS LETTERS, 1976, 28 (12) :706-708