XRD Analysis of Tungsten Thin Films.

被引：0
|
作者：
Djerdj, I. [1 ]
Tonejc, A. M. [1 ]
Tonejc, A. [1 ]
Radic, N. [2 ]
机构：
[1] Univ Zagreb, Fac Sci, Dept Phys, Zagreb 10002, Croatia
[2] Rudjer Boskovic Inst, Zagreb 10001, Croatia
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2004年 / 60卷
关键词：
Tungsten thin film; X-ray diffraction; Phase composition;
D O I：
10.1107/S0108767304095200
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
s8.m28.p14
引用
收藏
页码：S242 / S242
页数：1
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