Nontranslational three-dimensional profilometry by chromatic confocal microscopy with dynamically configurable micromirror scanning

被引:80
作者
Cha, SD [1 ]
Lin, PC [1 ]
Zhu, LJ [1 ]
Sun, PC [1 ]
Fainman, Y [1 ]
机构
[1] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92093 USA
关键词
D O I
10.1364/AO.39.002605
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A confocal microscope profilometer, which incorporates chromatic depth scanning with a diffractive optical element and a digital micromirror device for cofigurable transverse scanning, provides three-dimensional (3D) quantitative measurements without mechanical translation of either the sample or the microscope. me used a microscope with Various objective lenses (e.g., 40x, 60x, and 100x) to achieve different system characteristics. With a 100x objective, the microscope acquires stable measurements over a 320 mu m x 240 mu m surface area with a depth resolution of 0.39 mu m at a 3-Hz scan rate. The total longitudinal held of view is 26.4 mu m for a wavelength tuning range of 48.3 nm. The FWHM value of the longitudinal point-spread function is measured to be 0.99 mu m. We present 3D measurements of a four-phase-level diffractive element and an integrated-circuit chip. shown to be equivalent to those found with use of conventional mechanical scanning. Society of America OCIS codes: 180.1790, 120.0120.
引用
收藏
页码:2605 / 2613
页数:9
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