A fault isolation filter design using left eigenstructure assignment scheme

This paper presents a novel fault isolation filter design method using left eigenstructure assignment scheme proposed by the first author et al. The proposed method shows good performance of fault isolation with an exact eigenstructure assignment and guarantees that the corrupted gamma faults can be isolated simultaneously when the number of available output measurements are equal to or larger than (gamma + 1). A numerical example for the fault isolation filter is also included.