The low-cycle fatigue behavior and the relationship between the surface features in the low-cycle fatigue testing and the fatigue life of Sn-3.5Ag and Sn-0.7Cu lead-free solders were investigated at strain I-ate of 0.1%/s at room temperature, 80 and 120 degrees C. In addition, the fatigue life was estimated by using the surface deformation of the solders, and image processing. And also, it was compared with Coffin-Manson type of fatigue behavior. The fatigue life of Sn-3.5Ag solder was Superior to that of Sn-0.7Cu solder at temperatures, 80 and 120 degrees C. The fatigue life determined by surface deformation indicated a close behavior to Coffin-Manson type fatigue behavior in those solders. Therefore the low-cycle fatigue life of solders could be estimated by the Surface deformation.
机构:
Univ Teknol MARA, Fac Appl Sci, Perlis Campus, Arau 02600, Perlis, MalaysiaUniv Teknol MARA, Fac Appl Sci, Perlis Campus, Arau 02600, Perlis, Malaysia
Mayappan, R.
Salleh, A.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Teknol MARA Shah Alam, Fac Appl Sci, Shah Alam 40450, Selangor, MalaysiaUniv Teknol MARA, Fac Appl Sci, Perlis Campus, Arau 02600, Perlis, Malaysia
Salleh, A.
Andas, J.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Teknol MARA, Fac Appl Sci, Perlis Campus, Arau 02600, Perlis, MalaysiaUniv Teknol MARA, Fac Appl Sci, Perlis Campus, Arau 02600, Perlis, Malaysia
Andas, J.
4TH INTERNATIONAL CONFERENCE ON THE ADVANCEMENT OF MATERIALS AND NANOTECHNOLOGY (ICAMN IV 2016),
2017,
1877
机构:
Sun Yat Sen Univ, Sch Integrated Circuits, Guangzhou 510006, Peoples R ChinaSun Yat Sen Univ, Sch Integrated Circuits, Guangzhou 510006, Peoples R China
Li, L.
Li, Z. H.
论文数: 0引用数: 0
h-index: 0
机构:
South China Univ Technol, Sch Elect Power Engn, Guangzhou 510006, Peoples R ChinaSun Yat Sen Univ, Sch Integrated Circuits, Guangzhou 510006, Peoples R China
Li, Z. H.
Tang, Y.
论文数: 0引用数: 0
h-index: 0
机构:
Guangdong Polytech Normal Univ, Guangzhou 510225, Peoples R ChinaSun Yat Sen Univ, Sch Integrated Circuits, Guangzhou 510006, Peoples R China
Tang, Y.
Li, G. Y.
论文数: 0引用数: 0
h-index: 0
机构:
South China Univ Technol, Sch Elect Power Engn, Guangzhou 510006, Peoples R ChinaSun Yat Sen Univ, Sch Integrated Circuits, Guangzhou 510006, Peoples R China