Critical revision of GD-MS, LA-ICP-MS and SIMS as inorganic mass spectrometric techniques for direct solid analysis

被引:150
作者
Pisonero, Jorge [1 ]
Fernandez, Beatriz [2 ]
Guenther, Detlef [3 ]
机构
[1] Univ Oviedo, Dept Phys, Oviedo 33007, Spain
[2] Univ Oviedo, Dept Phys & Analyt Chem, E-33006 Oviedo, Spain
[3] ETH, Inorgan Chem Lab, CH-8093 Zurich, Switzerland
关键词
INDUCTIVELY-COUPLED PLASMA; FEMTOSECOND LASER-ABLATION; PULSED GLOW-DISCHARGE; RELATIVE SENSITIVITY FACTORS; MATRIX MATCHED CALIBRATION; PARTICLE-SIZE DISTRIBUTION; CHEMICAL-IONIZATION SOURCE; GLASS REFERENCE MATERIALS; DEPTH PROFILE ANALYSIS; NEAR-IR FEMTOSECOND;
D O I
10.1039/b904698d
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Inorganic mass spectrometric techniques and methods for direct solid analysis are widely required to obtain valuable information about the multi-elemental spatial distribution of the major and trace constituents and/or isotope ratio information of a sample in a wide variety of solid specimens, including environmental wastes, biological samples, geochemical materials, coatings and semiconductors. The increasing need to characterize complex materials in industry (e.g. production control and quality assurance processes), and in different fields of science is forcing the development of various inorganic mass spectrometric methods for direct solid chemical analysis. These methods allow the characterization of solid materials both in bulk and in spatially resolved analysis (with lateral and/or in-depth resolution). This review critically discusses the analytical performance, capabilities, pros and cons, and trends of laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS), secondary ion (neutral) mass spectrometry (SIMS/SNMS), and glow discharge mass spectrometry (GD-MS) because they represent the most widespread and powerful inorganic mass spectrometric methods currently further improved and applied for the direct characterization of solids.
引用
收藏
页码:1145 / 1160
页数:16
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