Degradation-shock-based Reliability Models for Fault-tolerant Systems
被引:20
|
作者:
Liu, Zhenyu
论文数: 0引用数: 0
h-index: 0
机构:
Beijing Inst Space Long March Vehicle, Beijing, Peoples R China
Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R ChinaBeijing Inst Space Long March Vehicle, Beijing, Peoples R China
Liu, Zhenyu
[1
,2
]
Ma, Xiaobing
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h-index: 0
机构:
Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R ChinaBeijing Inst Space Long March Vehicle, Beijing, Peoples R China
Ma, Xiaobing
[2
]
Shen, Lijuan
论文数: 0引用数: 0
h-index: 0
机构:
China Elect Power Res Inst, Beijing, Peoples R ChinaBeijing Inst Space Long March Vehicle, Beijing, Peoples R China
Shen, Lijuan
[3
]
Zhao, Yu
论文数: 0引用数: 0
h-index: 0
机构:
Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R ChinaBeijing Inst Space Long March Vehicle, Beijing, Peoples R China
Zhao, Yu
[2
]
机构:
[1] Beijing Inst Space Long March Vehicle, Beijing, Peoples R China
[2] Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China
[3] China Elect Power Res Inst, Beijing, Peoples R China
degradation;
shock model;
fault tolerant;
total ionizing dose;
single-event upset;
D O I:
10.1002/qre.1805
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Reliability modeling of fault-tolerant systems subject to shocks and natural degradation is important yet difficult for engineers, because the two external stressors are often positively correlated. Motivated by the fact that most radiation-induced failures are contributed from these two external stressors, a degradation-shock-based approach is proposed to model the failure process. The proposed model accommodates two kinds of failure modes: hard failure caused by shocks and soft failure caused by degradation. We consider a generalized m- shock model for systems with fault-tolerant design: failure occurs if the time lag between m sequential shocks is less than hours or degradation crosses a critical threshold. An example concerning memory chips used in space is presented to demonstrate the applicability of the proposed model. Copyright (c) 2015 John Wiley & Sons, Ltd.
机构:
Hiroshima Univ, Dep of Industrial, & Systems Engineering, Higasshi,, Jpn, Hiroshima Univ, Dep of Industrial & Systems Engineering, Higasshi, JpnHiroshima Univ, Dep of Industrial, & Systems Engineering, Higasshi,, Jpn, Hiroshima Univ, Dep of Industrial & Systems Engineering, Higasshi, Jpn