Degradation-shock-based Reliability Models for Fault-tolerant Systems

被引:20
|
作者
Liu, Zhenyu [1 ,2 ]
Ma, Xiaobing [2 ]
Shen, Lijuan [3 ]
Zhao, Yu [2 ]
机构
[1] Beijing Inst Space Long March Vehicle, Beijing, Peoples R China
[2] Beihang Univ, Sch Reliabil & Syst Engn, Beijing 100191, Peoples R China
[3] China Elect Power Res Inst, Beijing, Peoples R China
基金
中国国家自然科学基金;
关键词
degradation; shock model; fault tolerant; total ionizing dose; single-event upset;
D O I
10.1002/qre.1805
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Reliability modeling of fault-tolerant systems subject to shocks and natural degradation is important yet difficult for engineers, because the two external stressors are often positively correlated. Motivated by the fact that most radiation-induced failures are contributed from these two external stressors, a degradation-shock-based approach is proposed to model the failure process. The proposed model accommodates two kinds of failure modes: hard failure caused by shocks and soft failure caused by degradation. We consider a generalized m- shock model for systems with fault-tolerant design: failure occurs if the time lag between m sequential shocks is less than hours or degradation crosses a critical threshold. An example concerning memory chips used in space is presented to demonstrate the applicability of the proposed model. Copyright (c) 2015 John Wiley & Sons, Ltd.
引用
收藏
页码:949 / 955
页数:7
相关论文
共 50 条