Double negatively charged carbon vacancy at the h- and k-sites in 4H-SiC: Combined Laplace-DLTS and DFT study

被引:41
作者
Capan, Ivana [1 ]
Brodar, Tomislav [1 ]
Pastuovic, Zeljko [2 ]
Siegele, Rainer [2 ]
Ohshima, Takeshi [3 ]
Sato, Shin-ichiro [3 ]
Makino, Takahiro [3 ]
Snoj, Luka [4 ]
Radulovic, Vladimir [4 ]
Coutinho, Jose [5 ,6 ]
Torres, Vitor J. B. [5 ,6 ]
Demmouche, Kamel [7 ]
机构
[1] Rudjer Boskovic Inst, Div Mat Phys, Bijenicka 54, Zagreb 10000, Croatia
[2] Australian Nucl Sci & Technol Org, Ctr Accelerator Sci, 1New Illawarra Rd, Lucas Heights, NSW 2234, Australia
[3] Natl Inst Quantum & Radiol Sci & Technol, Takasaki Adv Radiat Res Inst, 1233 Watanuki, Takasaki, Gunma 3701292, Japan
[4] Jozef Stefan Inst, Jamova 39, Ljubljana 1000, Slovenia
[5] Univ Aveiro, Dept Phys, Campus Santiago, P-3810193 Aveiro, Portugal
[6] Univ Aveiro, I3N, Campus Santiago, P-3810193 Aveiro, Portugal
[7] Ctr Univ Belhadj Bouchaib Ain Temouchent, Inst Sci, BP 284, Ain Temouchent 46000, Algeria
关键词
DEEP-LEVEL DEFECTS; 4H SILICON-CARBIDE; POWER MOSFETS; IRRADIATION; DIODES;
D O I
10.1063/1.5011124
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present results from combined Laplace-Deep Level Transient Spectroscopy (Laplace-DLTS) and density functional theory studies of the carbon vacancy (V-C) in n-type 4H-SiC. Using Laplace-DLTS, we were able to distinguish two previously unresolved sub-lattice-inequivalent emissions, causing the broad Z(1/2) peak at 290K that is commonly observed by conventional DLTS in n-type 4H-SiC. This peak has two components with activation energies for electron emission of 0.58 eV and 0.65 eV. We compared these results with the acceptor levels of V-C obtained by means of hybrid density functional supercell calculations. The calculations support the assignment of the Z(1/2) signal to a superposition of emission peaks from double negatively charged V-C defects. Taking into account the measured and calculated energy levels, the calculated relative stability of V-C in hexagonal (h) and cubic (k) lattice sites, as well as the observed relative amplitude of the Laplace-DLTS peaks, we assign Z(1) and Z(2) to V-C(h) and V-C(k), respectively. We also present the preliminary results of DLTS and Laplace-DLTS measurements on deep level defects (ET1 and ET2) introduced by fast neutron irradiation and He ion implantation in 4H-SiC. The origin of ET1 and ET2 is still unclear. Published by AIP Publishing.
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页数:6
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