Multi terminal Signal Integrity Analysis

被引:0
作者
Suzuki, Goro [1 ]
机构
[1] Univ Kitakyusyu, Kitakyushu, Fukuoka, Japan
来源
2012 IEEE 11TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT-2012) | 2012年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Random walk method for power grid noise analysis, that treats lots of large valued decoupling capacitors and calculates voltage drops from VCC, has been existing. The computational complexity of this method is O((LM)-M-2), where L is the number of interconnects and M is the transient analysis elapsed time. Therefore, when we apply the existing technique to actual circuit, it becomes very time consuming. This paper proposes a novel technique which improve the computational complexity from O((LM)-M-2) to 0(L). Basic idea is inversing the transient analysis timestep order from successor to predecessor that is backward direction. The CPU time using proposed technique can be 6 (%) and 12 (%) compared with existing technique and SPICE, respectively for one interconnect analysis.
引用
收藏
页码:124 / 129
页数:6
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