Characterisation of an X-ray laser beam

被引：6

作者：

Le Pape, S ^{[1
]}

Zeitoun, P ^{[1
]}

Rocca, JJ ^{[1
]}

Carillon, A ^{[1
]}

Dhez, P ^{[1
]}

François, M ^{[1
]}

Hubert, S ^{[1
]}

Idir, M ^{[1
]}

Ros, D ^{[1
]}

机构：

[1] Univ Paris 11, Lab Spect Atom & Ion, F-91405 Orsay, France

来源：

SOFT X-RAY LASERS AND APPLICATIONS IV | 2001年 / 4505卷

关键词：

Michelson interferometer; Fourier Transform spectroscopy; 3D raytrace; Transient pumping X-ray laser; XUV wavefront sensor; capillary discharge X-ray laser;

D O I：

10.1117/12.450599

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report in this article the experimental and numerical tools, developed at the LSAI, for a complete characterization of an X-ray laser (XRL) beam. First, a Michelson interferometer has been used to realize a Fourrier transform spectroscopy experiment. A full comprehension of the measured linewidth requires a comparaison of the XRL beam amplification in the plasma to raytrace simulation. Results of transient pumping XRL simulations are presented in this article. The last section is dedicated to a description of the XUV Shack-Hartmann wavefront sensor we have developed, and to the study of the capillary discharge XRL beam.

引用

页码：23 / 34

页数：12

共 18 条

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