Quantum Dot FRET Linker Probes for Highly Sensitive DNA Methylation Detection

被引：0

作者：

Keeley, Brian ^{[1
]}

Zhang, Yi ^{[2
]}

Zhang, Ye ^{[2
]}

Stark, Alejandro ^{[1
]}

Wang, Tza-Huei ^{[1
,2
,3
]}

机构：

[1] Johns Hopkins Univ, Dept Mech Engn, Baltimore, MD 21218 USA

[2] Johns Hopkins Univ, Dept Biomed Engn, Baltimore, MD 21205 USA

[3] Johns Hopkins Univ, Ctr Canc Nanotechnol Excellence, Baltimore, MD 21210 USA

来源：

2012 12TH IEEE CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO) | 2012年

关键词：

Quantum Dot; FRET; DNA methylation; PCR;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

DNA methylation is an important cancer biomarker, but improving the detection sensitivity of DNA methylation remains a challenge for various types of biological samples. Here, we describe a novel quantum dot (QD)-based method using FRET linker probes (FLPs) that further increases the sensitivity of detection of DNA methylation patterns. This method relies on removing the background noise resulting from PCR inefficiencies. Compared to conventional non-specific QD-FRET detection, we demonstrate the improved detection of DNA methylation by fluorescence detection in bulk and with single molecule resolution.

引用

页数：4

共 10 条

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