Layer Number and Stacking Sequence Imaging of Few-Layer Graphene by Transmission Electron Microscopy

被引：59

作者：

Ping, Jinglei ^{[1
]}

Fuhrer, Michael S. ^{[1
]}

机构：

[1] Univ Maryland, Ctr Nanophys & Adv Mat, College Pk, MD 20742 USA

来源：

NANO LETTERS | 2012年 / 12卷 / 09期

关键词：

Graphene; layer number; stacking order; TEM; FILMS; GRAINS;

D O I：

10.1021/nl301932v

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A method based on dark field transmission electron microscopy is developed to quantitively investigate the layer number and stacking order of multilayer graphene, demonstrated here on multilayer crystalline graphene synthesized by chemical vapor deposition. Our results show that the relative intensities of first- and second-order diffraction spots and contrast in corresponding dark field images are sufficient to identify the layer number and stacking order of graphene with layer number up to seven (7) or more with few-nanometer spatial resolution.

引用

页码：4635 / 4641

页数：7

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