Refractive-index profiling of embedded microstructures in optical materials

被引：1
|
作者：
Davé, DP [1 ]
Milner, TE [1 ]
机构：
[1] Univ Texas, Dept Elect & Comp Engn, Austin, TX 78712 USA
来源：
APPLIED OPTICS | 2002年 / 41卷 / 10期
关键词：
D O I：
10.1364/AO.41.002038
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We describe use of a phase-sensitive low-coherence reflectometer to measure spatial variation of refractive index in optical materials. The described interferometric technique is demonstrated to be a valuable tool to profile the refractive index of optical elements such as integrated waveguides and photowritten optical microstructures. As an example, a refractive-index profile is mapped of a microstructure written in a microscope glass slide with an ultrashort-pulse laser. (C) 2002 Optical Society of America.
引用
收藏
页码：2038 / 2042
页数：5
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