Refractive-index profiling of embedded microstructures in optical materials

被引：1

作者：

Davé, DP ^{[1
]}

Milner, TE ^{[1
]}

机构：

[1] Univ Texas, Dept Elect & Comp Engn, Austin, TX 78712 USA

来源：

APPLIED OPTICS | 2002年 / 41卷 / 10期

关键词：

D O I：

10.1364/AO.41.002038

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We describe use of a phase-sensitive low-coherence reflectometer to measure spatial variation of refractive index in optical materials. The described interferometric technique is demonstrated to be a valuable tool to profile the refractive index of optical elements such as integrated waveguides and photowritten optical microstructures. As an example, a refractive-index profile is mapped of a microstructure written in a microscope glass slide with an ultrashort-pulse laser. (C) 2002 Optical Society of America.

引用

页码：2038 / 2042

页数：5

共 12 条

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