Study of microstructural, optical and electrical properties of Mg dopped SnO thin films

被引:26
作者
Ali, Syed Mansoor [1 ,2 ]
Muhammad, Jan [1 ]
Hussain, Syed Tajammul [2 ]
Abu Bakar, Shahzad [2 ,3 ]
Ashraf, Muhammad [4 ]
Naeem-ur-Rehman [5 ]
机构
[1] Islamia Univ Bahalwalpur, Dept Phys, Bahawalpur, Pakistan
[2] Quaid I Azam Univ, Natl Ctr Phys, NS&CD, Islamabad, Pakistan
[3] Quaid I Azam Univ, Dept Chem, Islamabad, Pakistan
[4] Opt Lab Islamabad, Islamabad, Pakistan
[5] Pakistan Inst Engn & Appl Sci, Dept Met & Mat Engn, Islamabad, Pakistan
关键词
TIN OXIDE; OXIDATION;
D O I
10.1007/s10854-013-1114-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Mg doped SnO thin films were fabricated via electron beam evaporator on the glass substrate. The XRD analysis showed that reference and Mg doped SnO thin films were consisted of tetragonal alpha-SnO phase with preferred directions along (101) and (002) orientations. It was observed that the intensity of the diffraction pattern peaks increased and crystallite size decreased with the Mg doping. Scanning electron microscopy showed that the needle-like particles having length in the range of 0.4-0.6 mu m with a diameter of 0.1-0.2 mu m are sintered together to form a compact structure of Sn1-xMgxO layer. In the Raman spectrum, two active mode (A(2u) and E-u) were observed for Sn1-xMgxO thin films. The complex plot (Nyquist plot) showed the data point laying on a single semicircle and the dc resistance increases with the increase of Mg doping concentration.
引用
收藏
页码:2432 / 2437
页数:6
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