Modeling the Performance of Single-Bit and Multi-Bit Quanta Image Sensors

被引：89

作者：

Fossum, Eric R. ^{[1
]}

机构：

[1] Thayer Sch Engn Dartmouth, Hanover, NH 03755 USA

来源：

IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | 2013年 / 1卷 / 09期

基金：

美国国家科学基金会;

关键词：

Active pixel sensor; APS; binary pixel; CIS; CMOS image sensor; low noise; multi-bit pixel; photon counting; photoelectron counting; Poisson statistics; QIS; quanta image sensor;

D O I：

10.1109/JEDS.2013.2284054

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Imaging performance metrics of single-bit and multi-bit photo-electron-counting quanta image sensors (QIS) are analyzed using Poisson arrival statistics. Signal and noise as a function of exposure are determined. The D-log H characteristic of single-bit sensors including overexposure latitude is quantified. Linearity and dynamic range are also investigated. Read-noise-induced bit-error rate is analyzed and a read-noise target of less than 0.15 e-rms is suggested.

引用

页码：166 / 174

页数：9