NICER Instrument Detector Subsystem: Description and Performance

被引:42
作者
Prigozhin, Gregory [1 ]
Gendreau, Keith
Doty, John P. [2 ]
Foster, Richard [1 ]
Remillard, Ronald [1 ]
Malonis, Andrew [1 ]
LaMarr, Beverly [1 ]
Vezie, Michael [1 ]
Egan, Mark [1 ]
Villasenor, Joel [1 ]
Arzoumanian, Zaven [5 ]
Baumgartner, Wayne
Scholze, Frank [3 ]
Laubis, Christian [3 ]
Krumrey, Michael [3 ]
Huber, Alan [4 ]
机构
[1] MIT, Kavli Inst Astrophys, 77 Massachusetts Ave, Cambridge, MA 02139 USA
[2] Noqsi Aerosp, Pine, CO USA
[3] Phys Tech Bundesanstalt, Berlin, Germany
[4] Amptek, Bedford, MA USA
[5] Univ Space Res Assoc, CRESST, Columbia, MD USA
来源
SPACE TELESCOPES AND INSTRUMENTATION 2016: ULTRAVIOLET TO GAMMA RAY | 2016年 / 9905卷
关键词
Silicon Drift Detectors; X-rays; spectroscopy; calibration; PTB;
D O I
10.1117/12.2231718
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An instrument called Neutron Star Interior Composition ExploreR (NICER) will be placed on-board the International Space Station in 2017. It is designed to detect soft X-ray emission from compact sources and to provide both spectral and high resolution timing information about the incoming flux. The focal plane is populated with 56 customized Silicon Drift Detectors. The paper describes the detector system architecture, the electronics and presents the results of the laboratory testing of both flight and engineering units, as well as some of the calibration results obtained with synchrotron radiation in the laboratory of PTB at BESSY II.
引用
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页数:12
相关论文
共 7 条
[1]   A quarter-century of metrology using synchrotron radiation by PTB in Berlin [J].
Beckhoff, Burkhard ;
Gottwald, Alexander ;
Klein, Roman ;
Krumrey, Michael ;
Mueller, Ralph ;
Richter, Mathias ;
Scholze, Frank ;
Thornagel, Reiner ;
Ulm, Gerhard .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2009, 246 (07) :1415-1434
[2]  
Gendreau K.C., 2015, US Patent, Patent No. [9,117,622, 9117622]
[3]  
Gendreau K. C., 2016, P SPIE, V9905, p99051H
[4]   The PTB high-accuracy spectral responsivity scale in the VUV and x-ray range [J].
Gottwald, A. ;
Kroth, U. ;
Krumrey, M. ;
Richter, M. ;
Scholze, F. ;
Ulm, G. .
METROLOGIA, 2006, 43 (02) :S125-S129
[5]  
GROOM D, 2006, P SPIE, V6068
[6]  
Loo B., 1998, IEEE T NUCL SCI, V35, P114
[7]  
Prigozhin G., 2014, P SPIE, V8453