Growth and ferroelectric properties of sol-gel derived (PbLa) TiO3 films on metallic LaNiO3-coated substrates

被引：10
|
作者：
Li, AD
Ge, CZ
Lu, P
Wu, D
Xiong, SB
Ming, NB
机构：
[1] CCAST,WORLD LAB,BEIJING 100080,PEOPLES R CHINA
[2] NANJING UNIV,CTR ADV STUDIES SCI & TECHNOL MICROSTRUCT,NANJING 210093,PEOPLES R CHINA
来源：
MATERIALS LETTERS | 1997年 / 31卷 / 1-2期
关键词：
PLT thin film; lead lanthanum titanate; sol-gel; LaNiO3; electrode; ferroelectricity; poling; silicon substrates; LaAlO3; substrates;
D O I：
10.1016/S0167-577X(96)00247-9
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Metallic LaNiO3 (LNO) films were prepared on LaAlO3 (LAO) and Si substrates by metalorganic decomposition (MOD) and their application as the bottom electrode for sol-gel derived PLT (Pb0.85La0.15Ti0.9625O3) thin films. X-ray diffraction, scanning electron microscopy and electrical measurements were used to characterize the multilayer films of PLT/LNO/substrate. PLT films on LNO-coated LAO exhibited a strongly preferred (100)-orientation and smooth surface with fine grains (approximate to 50 nm). Film capacitors with a configuration In/PLT/LNO/substrate showed promising ferroelectric hysteresis. It was found that by applying an electric field exceeding a threshold value of approximate to 250-300 kV/cm across the film, the ferroelectric hysteresis loop was enhanced significantly as a result of the poling.
引用
收藏
页码：15 / 18
页数：4
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