Spherical quartz crystals investigated with synchrotron radiation

被引：17

作者：

Pereira, N. R. ^{[1
]}

Macrander, A. T. ^{[2
]}

Hill, K. W. ^{[3
]}

Baronova, E. O. ^{[4
]}

George, K. M. ^{[5
]}

Kotick, J. ^{[5
]}

机构：

[1] Ecopulse Inc, Springfield, VA 22152 USA

[2] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[3] Princeton Plasma Phys Lab, Princeton, NJ 08536 USA

[4] Kurchatov Inst, Moscow, Russia

[5] Ohio State Univ, Columbus, OH 43210 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2015年 / 86卷 / 10期

关键词：

Quartz - Synchrotrons - X ray diffraction;

D O I：

10.1063/1.4934197

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The quality of x-ray spectra and images obtained from plasmas with spherically bent crystals depends in part on the crystal's x-ray diffraction across the entire crystal surface. We employ the energy selectivity and high intensity of synchrotron radiation to examine typical spherical crystals from alpha-quartz for their diffraction quality, in a perpendicular geometry that is particularly convenient to examine sagittal focusing. The crystal's local diffraction is not ideal: the most noticeable problems come from isolated regions that so far have failed to correlate with visible imperfections. Excluding diffraction from such problem spots has little effect on the focus beyond a decrease in background. (C) 2015 AIP Publishing LLC.

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页数：9

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