Analysis of Crosstalk Delay using Mixed CNT Bundle based Through Silicon Vias

被引:0
|
作者
Majumder, Manoj Kumar [1 ]
Kumari, Archana [1 ]
Kaushik, B. K. [1 ]
Manhas, S. K. [1 ]
机构
[1] Indian Inst Technol Roorkee, Roorkee 247667, Uttarakhand, India
关键词
Carbon nanotube (CNT); mixed CNT bundle (MCB); through silicon vias (TSVs); crosstalk; delay; nanotechnology; CARBON NANOTUBES; PERFORMANCE ANALYSIS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This research paper presents a new method to reduce crosstalk of carbon nanotube (CNT) bundle based through silicon vias (TSVs). For this, a unique structure of mixed CNT bundled (MCB) TSV is proposed with specific arrangement of single-(SWCNT) and multi-walled CNTs (MWCNTs). An equivalent electrical model is presented for different MCB configurations wherein MWCNTs are placed at peripheral layers to the centrally located SWCNTs. A significant reduction in crosstalk induced delay is observed for higher number of peripheral layers containing MWCNTs. For different TSV heights, the overall reduction in crosstalk induced delay is 44.03% using novel MCB instead of conventional SWCNT bundle.
引用
收藏
页码:441 / 444
页数:4
相关论文
共 50 条
  • [21] Design of MWCNT based Through Silicon Vias with Polymer Liners to Reduce the Crosstalk Effects
    Basha, Shaik Javid
    Kumar, Vobulapuram Ramesh
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2020, 9 (04)
  • [22] An Enhancement of Crosstalk Avoidance Code Based on Fibonacci Numeral System for Through Silicon Vias
    Cui, Xiaole
    Cui, Xiaoxin
    Ni, Yewen
    Miao, Min
    Jin Yufeng
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 25 (05) : 1601 - 1610
  • [23] Delay and crosstalk reliability issues in mixed MWCNT bundle interconnects
    Majumder, Manoj Kumar
    Das, Pankaj Kumar
    Kaushik, Brajesh Kumar
    MICROELECTRONICS RELIABILITY, 2014, 54 (11) : 2570 - 2577
  • [24] Electrical Modeling and Analysis of Cu-CNT Heterogeneous Coaxial Through-Silicon Vias
    Lu, Qijun
    Zhu, Zhangming
    Yang, Yintang
    Ding, Ruixue
    Li, Yuejin
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2017, 16 (04) : 695 - 702
  • [25] Impact of Voltage Bias on Through Silicon Vias (TSV) Depletion and Crosstalk
    Piersanti, S.
    de Paulis, F.
    Orlandi, A.
    Fan, J.
    Drewniak, J.
    Achkir, B.
    2016 IEEE 20TH WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI), 2016,
  • [26] Circuit Modeling of Cu/CNT Composite Through-Silicon Vias (TSV)
    Zheng, Jie
    Su, Zhi-Qiang
    Wang, Guan-Yi
    Li, Meng
    Zhao, Wen-Sheng
    Wang, Gaofeng
    2015 IEEE MTT-S INTERNATIONAL MICROWAVE WORKSHOP SERIES ON ADVANCED MATERIALS AND PROCESSES FOR RF AND THZ APPLICATIONS (IMWS-AMP), 2015, : 422 - 424
  • [27] Crosstalk optimization for through-silicon vias by exploiting temporal signal misalignment
    Bamberg, Lennart
    Joseph, Jan Moritz
    Pionteck, Thilo
    Garcia-Ortiz, Alberto
    INTEGRATION-THE VLSI JOURNAL, 2019, 67 : 60 - 72
  • [28] Compact AC Modeling and Analysis of Cu, W, and CNT based Through-Silicon Vias (TSVs) in 3-D ICs
    Xu, Chuan
    Li, Hong
    Suaya, Roberto
    Banerjee, Kaustav
    2009 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, 2009, : 487 - +
  • [29] Temperature-dependent crosstalk and frequency spectrum analyses in adjacent interconnects of a mixed CNT bundle
    Sharma, Manvi
    Rai, Mayank Kumar
    Khanna, Rajesh
    JOURNAL OF COMPUTATIONAL ELECTRONICS, 2020, 19 (01) : 177 - 190
  • [30] Temperature-dependent crosstalk and frequency spectrum analyses in adjacent interconnects of a mixed CNT bundle
    Manvi Sharma
    Mayank Kumar Rai
    Rajesh Khanna
    Journal of Computational Electronics, 2020, 19 : 177 - 190