On the rigorous calculation of all ohmic losses in rectangular waveguide multi-port junctions

被引：2

作者：

Taroncher, M ^{[1
]}

Cogollos, S ^{[1
]}

Boria, VE ^{[1
]}

Gimeno, B ^{[1
]}

Vidal, A ^{[1
]}

Hueso, J ^{[1
]}

Hidalgo, I ^{[1
]}

机构：

[1] Univ Politecn Valencia, Dpto Comunicac, E-46022 Valencia, Spain

来源：

2005 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM, VOLS 1-4 | 2005年

关键词：

losses; multiport circuits; waveguide junctions; waveguides; theory of cavities; admittance matrix;

D O I：

10.1109/MWSYM.2005.1516523

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, all ohmic losses effects present in rectangular waveguide multi-port junctions are rigorous and efficiently computed. For this purpose, a new formulation based on the theory of cavities, which provides generalized admittance matrix representations for such junctions, is proposed. To validate this theory, we have successfully compared our results with numerical data of a lossy E-plane T-junction and of a hollow waveguide, as well as with experimental measurements of a real H-plane T-junction.

引用

页码：71 / 74

页数：4

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