High-Q optical nanobeam cavities for label-free sensing

被引：3

作者：

Rahman, M. Ghazali A. ^{[1
]}

Velha, Philippe ^{[1
]}

De la Rue, Richard M. ^{[1
]}

Johnson, Nigel P. ^{[1
]}

机构：

[1] Univ Glasgow, Sch Engn, Optoelect Res Grp, Glasgow G12 8LY, Lanark, Scotland

来源：

OPTICAL SENSORS 2013 | 2013年 / 8774卷

关键词：

silicon photonics; SOI; nanobeam microcavity; optical sensor; QUALITY-FACTOR;

D O I：

10.1117/12.2017696

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The design, modeling, fabrication, and experimental measurements on optical nanobeam cavities that change resonant frequency in response to changes in the refractive index of the surrounding environment are presented. Nanobeam cavities based on Silicon-On-Insulator (SOI) that work at telecommunication wavelengths (1550 nm) provide an ideal platform for label-free sensing, due to their features of high resonance Q-factors, high sensitivity and capability for integration with silicon CMOS.

引用

页数：8

共 7 条

[1]

Densmore A., 2006, IEEE PHOTONICS TECHN, V18

[2] Closure of the stop-band in photonic wire Bragg gratings [J].

Gnan, M. ;

Hopman, W. C. L. ;

Bellanca, G. ;

de Ridder, R. M. ;

De La Rue, R. M. ;

Bassi, P. .

OPTICS EXPRESS, 2009, 17 (11) :8830-8842

[3]

Mahmood W., 1988, APPL OPTICS, V27

[4]

Richard M, 2010, CAOL 2010 INT C ADV

[5] Ultra high quality factor one dimensional photonic crystal/photonic wire micro-cavities in silicon-on-insulator (SOI) [J].

Zain, Ahmad Rifqi Md ;

Johnson, Nigel P. ;

Sorel, Marc ;

De la Rue, Richard M. .

OPTICS EXPRESS, 2008, 16 (16) :12084-12089

[6] Tapered photonic crystal microcavities embedded in photonic wire waveguides with large resonance quality-factor and high transmission [J].

Zain, Ahmad Rifqi Md ;

Gnan, Marco ;

Chong, Harold M. H. ;

Sorel, Marc ;

De La Rue, Richard M. .

IEEE PHOTONICS TECHNOLOGY LETTERS, 2008, 20 (1-4) :6-8

[7] High Quality-Factor 1-D-Suspended Photonic Crystal/Photonic Wire Silicon Waveguide Micro-Cavities [J].

Zain, Ahmad Rifqi Md ;

Johnson, Nigel P. ;

Sorel, Marc ;

De La Rue, Richard M. .

IEEE PHOTONICS TECHNOLOGY LETTERS, 2009, 21 (24) :1789-1791

← 1 →