Scanning probe arrays for life sciences and nanobiology applications

被引:34
作者
Aeschimann, L
Meister, A
Akiyama, T
Chui, BW
Niedermann, P
Heinzelmann, H
De Rooij, NF
Staufer, U
Vettiger, P
机构
[1] Univ Neuchatel, Inst Microtechnol, CH-2007 Neuchatel, Switzerland
[2] CSEM SA, Swiss Ctr Elect & Microtechnol, CH-2007 Neuchatel, Switzerland
关键词
scanning probe array; life science; nanobiology; piezoresistive sensing; parallel imaging; AFM;
D O I
10.1016/j.mee.2006.01.201
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Various 1D and 2D scanning probe arrays with integrated piezoresistive sensors have been developed in view of nanobiology and life science applications. For such applications, the experiments Deed usually to be performed under liquid conditions. The probe arrays have been fabricated by using silicon micromachining techniques and SOI wafers. For biological applications, when the cantilevers are immersed in electrically conductive buffer environments, the piezoresistive sensing elements have to be protected. For this purpose, the sensors were coated with a 50 nm thick silicon nitride film. The realized piezoresistive cantilevers had low spring constants between 0.1 and 0.5 N/m, well suited for biological applications. Parallel imaging using a 1 x 2 probe array was demonstrated by simultaneous imaging of a test sample in buffer solution. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1698 / 1701
页数:4
相关论文
共 8 条
[1]   Environmental sensors based on micromachined cantilevers with integrated read-out [J].
Boisen, A ;
Thaysen, J ;
Jensenius, H ;
Hansen, O .
ULTRAMICROSCOPY, 2000, 82 (1-4) :11-16
[2]   Low-stiffness silicon cantilevers for thermal writing and piezoresistive readback with the atomic force microscope [J].
Chui, BW ;
Stowe, TD ;
Kenny, TW ;
Mamin, HJ ;
Terris, BD ;
Rugar, D .
APPLIED PHYSICS LETTERS, 1996, 69 (18) :2767-2769
[3]   Force spectroscopy with single bio-molecules [J].
Clausen-Schaumann, H ;
Seitz, M ;
Krautbauer, R ;
Gaub, HE .
CURRENT OPINION IN CHEMICAL BIOLOGY, 2000, 4 (05) :524-530
[4]   1/F noise considerations for the design and process optimization of piezoresistive cantilevers [J].
Harley, JA ;
Kenny, TW .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2000, 9 (02) :226-235
[5]   Centimeter scale atomic force microscope imaging and lithography [J].
Minne, SC ;
Adams, JD ;
Yaralioglu, G ;
Manalis, SR ;
Atalar, A ;
Quate, CF .
APPLIED PHYSICS LETTERS, 1998, 73 (12) :1742-1744
[6]   ATOMIC RESOLUTION WITH AN ATOMIC FORCE MICROSCOPE USING PIEZORESISTIVE DETECTION [J].
TORTONESE, M ;
BARRETT, RC ;
QUATE, CF .
APPLIED PHYSICS LETTERS, 1993, 62 (08) :834-836
[7]   The "millipede" -: Nanotechnology entering data storage [J].
Vettiger, P ;
Cross, G ;
Despont, M ;
Drechsler, U ;
Dürig, U ;
Gotsmann, B ;
Häberle, W ;
Lantz, MA ;
Rothuizen, HE ;
Stutz, R ;
Binnig, GK .
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2002, 1 (01) :39-55
[8]   Optimization of sensitivity and noise in piezoresistive cantilevers [J].
Yu, XM ;
Thaysen, J ;
Hansen, O ;
Boisen, A .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (10) :6296-6301