Thickness Influence on Optical and Electrical Properties of Pbl2 Films Prepared by Pulsed Laser Deposition

被引：7
|
作者：
Fan, Haibo [1 ,2 ,3 ]
Ren, Xianpei [1 ,2 ]
Yang, Zhou [1 ,2 ]
Ren, Xiaodong [1 ,2 ]
Xiao, Fengwei [1 ,2 ]
Zi, Wei [1 ,2 ]
Yin, Mingli [1 ,2 ,4 ]
Liu, Shengzhong [1 ,2 ,5 ]
机构：
[1] Natl Minist Educ, Key Lab Appl Surface & Colloid Chem, Xian 710119, Shaanxi, Peoples R China
[2] Shaanxi Normal Univ, Sch Mat Sci & Engn, Shaanxi Engn Lab Adv Energy Technol, Xian 710119, Shaanxi, Peoples R China
[3] Northwest Univ Xian, Sch Phys, Xian 710069, Shaanxi, Peoples R China
[4] Xian Technol Univ, Sch Sci, Xian 710062, Shaanxi, Peoples R China
[5] Chinese Acad Sci, Dalian Natl Lab Clean Energy, Dalian Inst Chem Phys, Dalian 116023, Peoples R China
来源：
SCIENCE OF ADVANCED MATERIALS | 2018年 / 10卷 / 05期
关键词：
Pbl(2); Thickness; Optical Band Gap; Electrical Resistivity; Pulsed Laser Deposition; ORGANOMETAL HALIDE PEROVSKITES; PBI2; THIN-FILMS; SOLAR-CELLS; LEAD IODIDE; RAMAN-SPECTROSCOPY; MORPHOLOGY; GROWTH; PLD; INTERCALATION; TEMPERATURE;
D O I：
10.1166/sam.2018.3233
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Lead iodide (Pbl(2)) films with a thickness from 66 to 416 nm were prepared on glass and FTO substrates by pulsed laser deposition (PLD) technique for the first time, using a KrF excimer laser. Scanning electron microscope (SEM) images revealed the surface topographical evolution and the Volmer-Weber growth mode of the films was verified. X-ray diffractometer (XRD) measurements proved the polycrystalline nature of the deposited films with preferred orientation along (001) plane. UV-Vis-NIR measurements revealed a strong influence of thickness on the optical band gaps of the films, which decrease with the increase of thickness. It was also demonstrated that the electrical resistivities in lateral and vertical directions both decrease with the increase of film thickness.
引用
收藏
页码：701 / 706
页数：6
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