Microstructures and impedance studies of Bi3.15Nd0.85Ti3O12 thin films

被引:7
作者
Wu, Di [1 ,2 ]
Li, Aidong [1 ,2 ]
机构
[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Dept Mat Sci & Engn, Nanjing 210093, Peoples R China
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2009年 / 95卷 / 02期
基金
中国国家自然科学基金;
关键词
FERROELECTRIC PROPERTIES; DIELECTRIC CHARACTERIZATION; CONDUCTIVITY; TITANATE;
D O I
10.1007/s00339-008-4935-y
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microstructures and impedance characteristics of chemical-solution-derived Bi3.15Nd0.85Ti3O12 thin films were studied as functions of temperature. A dielectric anomaly was found at around 450A degrees C, corresponding to the paraelectric to ferroelectric transition. Via complex impedance studies, grain and grain boundary contributions to the impedance were separated. The resistance of grain and grain boundaries is found governed by the same kind of space charge with an activation energy around 1.1 eV, close to that of oxygen vacancies in perovskite ferroelectrics. The low temperature ac conductance of BNdT thin films shows a frequency dispersion, which can also be ascribed to space charges mainly due to oxygen vacancies. The results were compared with SrBi2Ta2O9 in terms of oxygen vacancy conductivity.
引用
收藏
页码:517 / 521
页数:5
相关论文
共 24 条
  • [1] Impedance spectroscopy of SrBi2Ta2O9 and SrBi2Nb2O9 ceramics correlation with fatigue behavior
    Chen, TC
    Thio, CL
    Desu, SB
    [J]. JOURNAL OF MATERIALS RESEARCH, 1997, 12 (10) : 2628 - 2637
  • [2] Layered perovskites with giant spontaneous polarizations for nonvolatile memories
    Chon, U
    Jang, HM
    Kim, MG
    Chang, CH
    [J]. PHYSICAL REVIEW LETTERS, 2002, 89 (08) : 1 - 087601
  • [3] Dielectric properties of layered perovskite Sr1-xAxBi2Nb2O9 ferroelectrics (A=La, Ca and x=0,0.1)
    Forbess, MJ
    Seraji, S
    Wu, Y
    Nguyen, CP
    Cao, GZ
    [J]. APPLIED PHYSICS LETTERS, 2000, 76 (20) : 2934 - 2936
  • [4] Investigation of structural and ferroelectric properties of pulsed-laser-ablated epitaxial Nd-doped bismuth titanate films
    Garg, A
    Snedden, A
    Lightfoot, P
    Scott, JF
    Hu, X
    Barber, ZH
    [J]. JOURNAL OF APPLIED PHYSICS, 2004, 96 (06) : 3408 - 3412
  • [5] Orientation dependence of ferroelectric properties of pulsed-laser-ablated Bi4-xNdxTi3O12 films
    Garg, A
    Barber, ZH
    Dawber, M
    Scott, JF
    Snedden, A
    Lightfoot, P
    [J]. APPLIED PHYSICS LETTERS, 2003, 83 (12) : 2414 - 2416
  • [6] Jonscher A.K., 1983, Dielectric Relaxation in Solids
  • [7] Low-frequency dielectric relaxation and ac conduction of SrBi2Ta2O9 thin film grown by pulsed laser deposition
    Kim, IW
    Ahn, CW
    Kim, JS
    Song, TK
    Bae, JS
    Choi, BC
    Jeong, JH
    Lee, JS
    [J]. APPLIED PHYSICS LETTERS, 2002, 80 (21) : 4006 - 4008
  • [8] Large remanent polarization of (Bi,Nd)4Ti3O12 epitaxial thin films grown by metalorganic chemical vapor deposition
    Kojima, T
    Sakai, T
    Watanabe, T
    Funakubo, H
    Saito, K
    Osada, M
    [J]. APPLIED PHYSICS LETTERS, 2002, 80 (15) : 2746 - 2748
  • [9] Kumar MM, 2001, J APPL PHYS, V90, P934, DOI 10.1063/1.1383267
  • [10] ELECTRICAL-CONDUCTIVITY IN PZT-TYPE AND PT-TYPE PIEZOCERAMICS
    LEE, YY
    WU, L
    LIANG, CK
    WU, TS
    [J]. FERROELECTRICS, 1993, 138 (1-4) : 11 - 22