FEL simulation of the 0.1-nm Hard X-ray from the PAL-XFEL

被引:2
作者
Hwang, Ilmoon [1 ]
Han, Jang-Hui [1 ]
Parc, Yong Woon [1 ]
Lee, Jaeyu [2 ]
机构
[1] Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea
[2] Pohang Univ Sci & Technol, Dept Phys, Pohang 790784, South Korea
关键词
Free-electron laser; Self-amplified spontaneous emission; Micro-bunching; Undulator; Wakefield;
D O I
10.3938/jkps.64.212
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL) will provide X-ray FEL radiation in the range of 0.1 and 10 nm with five undulator beamlines. An undulator beamline for hard X-ray is designed for 0.1-nm self-amplified spontaneous emission FEL. When a 200-pC electron bunch with a 10-GeV energy and a 0.5-mu m center dot rad normalized emittance passes the undulators, 10(12) photons at 0.1 nm will be generated within 100 fs. The wakefield effect of the vacuum chamber may reduce the radiation power significantly, but a proper tapering in the undulator can recover the power. We present a study in which GENESIS 1.3 was used for the FEL simulation.
引用
收藏
页码:212 / 216
页数:5
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