Geometrical enhancement of field emission of individual nanotubes studied by in situ transmission electron microscopy

被引：93
|
作者：
Xu, Z
Bai, XD [1 ]
Wang, EG
机构：
[1] Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China
[2] Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China
来源：
APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 13期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1063/1.2188389
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Field emission of an individual multiwalled carbon nanotube, driven by a customer-built piezomanipulator, was measured in a transmission electron microscope. The measurement geometry and the nanotube structure were imaged in situ. A linear dependence of field enhancement factor beta on the distance d between the nanotube tip and its counteranode is found. The enhanced field emission mechanism is studied by a tip-flat emission model. The results indicate that the radius of emission apex r is an important factor in field emission with a relationship of beta proportional to r(-1/2), while the tube length has little influence on beta. (c) 2006 American Institute of Physics.
引用
收藏
页数：3
相关论文
共 50 条
  • [21] Oxidation behavior of cobalt nanoparticles studied by in situ environmental transmission electron microscopy
    Zhang, Dejiong
    Jin, Chuanhong
    Li, Z. Y.
    Zhang, Ze
    Li, Jixue
    SCIENCE BULLETIN, 2017, 62 (11) : 775 - 778
  • [22] Formation processes of iron silicide nanoparticles studied by ex situ and in situ transmission electron microscopy
    Won, Jonghan
    Kovacs, Andras
    Naito, Muneyuki
    Ishimaru, Manabu
    Hirotsu, Yoshihiko
    JOURNAL OF APPLIED PHYSICS, 2007, 102 (10)
  • [23] Oxidation behavior of cobalt nanoparticles studied by in situ environmental transmission electron microscopy
    Dejiong Zhang
    Chuanhong Jin
    Z.Y.Li
    Ze Zhang
    Jixue Li
    ScienceBulletin, 2017, 62 (11) : 775 - 778
  • [24] Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes
    Zhou, Y. S.
    Yi, K. J.
    Mahjouri-Samani, M.
    Xiong, W.
    Lu, Y. F.
    Liou, S. -H.
    APPLIED SURFACE SCIENCE, 2009, 255 (07) : 4341 - 4346
  • [25] DETAILS OF MICROSTRUCTURE AND GEOMETRICAL CONFIGURATION OF INTEGRATED-CIRCUITS STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY
    OPPOLZER, H
    HUBER, V
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (67): : 461 - 466
  • [26] Direct Observations of the Growth of Carbon Nanotubes using in situ Transmission Electron Microscopy
    Sharma, R.
    Rez, P.
    Treacy, M. M. J.
    E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY, 2006, 4 : 460 - 463
  • [27] Stability of carbon nanotubes under electric field studied by scanning electron microscopy
    Wei, Y
    Xie, CG
    Dean, KA
    Coll, BF
    APPLIED PHYSICS LETTERS, 2001, 79 (27) : 4527 - 4529
  • [28] In situ imaging of field emission from individual carbon nanotubes and their structural damage
    Wang, ZL
    Gao, RP
    de Heer, WA
    Poncharal, P
    APPLIED PHYSICS LETTERS, 2002, 80 (05) : 856 - 858
  • [29] Interpretation of the field enhancement factor for electron emission from carbon nanotubes
    Smith, R. C.
    Silva, S. R. P.
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (01)
  • [30] Quantifying the growth of individual graphene layers by in situ environmental transmission electron microscopy
    Kling, Jens
    Hansen, Thomas W.
    Wagner, Jakob B.
    CARBON, 2016, 99 : 261 - 266
12345