Anomalous Electrical Resistivity of CeRh2Si2 near the Pressure-Induced Quantum Critical Point

被引:1
|
作者
Ohashi, Masashi [1 ]
Oomi, Gendo [1 ]
Koiwai, Sadayoshi [2 ]
Uwatoko, Yoshiya [3 ]
机构
[1] Kyushu Univ, Dept Phys, Ropponmatsu 8108560, Japan
[2] Saitama Univ, Dept Phys, Urawa 3380825, Japan
[3] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan
关键词
CeRh2Si2; electrical resistivity; high pressure; quantum critical point;
D O I
10.1143/JPSJS.71S.362
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The electrical resistivity of single crystalline CeRh2Si2 has been measured at high pressure up to 8 GPa, low temperature down to 2.0 K and high magnetic field up to 9T. The rho(T) curve is fitted by the formula rho(T)= rho(0) + AT(n) at low-temperature. While the power a. shows almost constant vahie 2 in a wide pressure range, it is found that A(P) shows an anomaly near P01-1.0 GPa and po(P) near P-C2 similar to 0.6 GPa, both of which corresponds the pressures where the magnetic ordering phases disappear. On the other hand, the magnitude of the magnetoresistance, Delta R(P, H = 9T)R(P) at 4.2 K, shows a sudden decrease near P-C2. These results are discussed on the basis of pressure-induced quantum phase transition.
引用
收藏
页码:362 / 364
页数:3
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