Input pattern classification for transistor level testing of bridging faults in BiCMOS circuits

被引：0

作者：

Menon, SM ^{[1
]}

Jayasumana, AP ^{[1
]}

Malaiya, YK ^{[1
]}

机构：

[1] S DAKOTA SCH MINES & TECHNOL,DEPT ELECT & COMP ENGN,RAPID CITY,SD 57701

来源：

SIXTH GREAT LAKES SYMPOSIUM ON VLSI, PROCEEDINGS | 1996年

关键词：

D O I：

10.1109/GLSV.1996.497622

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：214 / 219

页数：6

共 34 条

[1] Input pattern classification for detection of stuck-ON and bridging faults using I-DDQ testing in BiCMOS and CMOS circuits
Menon, SM
Malaiya, YK
Jayasumana, AP
TENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 1997, : 545 - 546
[2] Modelling and testing for bridging faults in CMOS and BiCMOS combinational circuits
Ismaeel, AA
Bhatnagar, R
INTERNATIONAL JOURNAL OF ELECTRONICS, 1997, 83 (04) : 529 - 540
[3] Modeling and testing for stuck faults in BiCMOS combinational circuits
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Bhatnagar, R
MICROELECTRONICS JOURNAL, 1997, 28 (6-7) : 663 - 681
[4] Testing the realistic bridging faults in CMOS circuits
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Lo, JC
1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS, 1996, : 84 - 88
[5] Test input generation for supply current testing of bridging faults in bipolar combinational logic circuits
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Hashizume, M
Tamesada, T
1998 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, PROCEEDINGS, 1998, : 14 - 18
[6] Logic testing of bridging faults in CMOS integrated circuits
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[7] Subcircuit Pattern Recognition in Transistor Level Circuits
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Pattern Recognition and Image Analysis, 2020, 30 : 160 - 169
[8] Subcircuit Pattern Recognition in Transistor Level Circuits
Cheremisinov, D.
Cheremisinova, L.
PATTERN RECOGNITION AND IMAGE ANALYSIS, 2020, 30 (02) : 160 - 169
[9] Pseudo-random pattern testing of bridging faults
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McCluskey, EJ
INTERNATIONAL CONFERENCE ON COMPUTER DESIGN - VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS, 1997, : 54 - 60
[10] Analysis and testing of bridging faults in CMOS synchronous sequential circuits
Miura, Y
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2004, E87D (03): : 564 - 570

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