Measurement of Specific Capacitance for Nb/Al-AlOx/Nb Josephson Junctions in Single-Flux Quantum Circuit Applications

被引:13
作者
Xiong, Wei [1 ,2 ]
Xu, Wanning [1 ,2 ]
Wu, Yu [1 ,3 ]
Li, Guanqun [1 ,2 ]
Ying, Liliang [1 ]
Peng, Wei [1 ,2 ]
Ren, Jie [1 ,2 ]
Wang, Zhen [1 ,2 ,3 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
[3] ShanghaiTech Univ, Shanghai 200031, Peoples R China
基金
中国国家自然科学基金;
关键词
Fiske mode resonance; junction specific capacitance; Josephson plasma resonance; SQUID resonance; KA/CM(2);
D O I
10.1109/TASC.2018.2812737
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, we investigate different technologies to measure the specific capacitances C-s of Nb/Al-AlOx/Nb Joseph-son junctions. They involve measuring Fiske mode resonance in long Josephson junctions, superconducting quantum interference device (SQUID) resonance, and Josephson plasma resonance. We find a logarithmic relationship between the junction C-s and its critical current density J(c) in the range 0.1-2 kA/cm(2) using the Fiske mode resonance method. Our measured C-s values using SQUID resonance and Josephson plasma resonance are compared with the results obtained by other groups via analyzing the major errors in the C-s calculation. We discuss the accuracy in evaluating C-s for all three techniques and suggest using Fiske mode resonance as a relatively stable method for C-s extraction for the future design of our single-flux quantum circuit.
引用
收藏
页数:5
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