Infrared microspectroscopy with synchrotron radiation

The brightness, spectral distribution, and low noise of synchrotron radiation are major advantages for Fourier-transform infrared microspectroscopy. The infrared radiant emission from the National Synchrotron Light Source (NSLS) is 100-1000 times brighter than that from a 1500 K thermal-emission source [1]. Using synchrotron radiation, an Ir mu s (Nicolet Corp.) microspectrometer system demonstrated spatial resolution unequaled by conventional sources. With this system, spectra with a signal-to-noise ratio greater than 200:1 could be collected in less than 5 seconds From a 6 x 6 mu m sample area (defined by dual confocal remote apertures). With 6 x 6 mu m confocal dual apertures, the system clearly resolved 4 mu m wide layers in a multilayered laminate.