High performance interband cascade lasers at 3.8 microns

被引:18
作者
Leavitt, R. P. [1 ]
Bruno, J. D. [1 ]
Bradshaw, J. L. [1 ]
Lascola, K. M. [1 ]
Pham, J. T. [1 ]
Towner, F. J. [1 ]
Suchalkin, S. [2 ]
Belenky, G. [2 ]
Vurgaftman, I. [3 ]
Canedy, C. L. [3 ]
Bewley, W. W. [3 ]
Kim, C. S. [3 ]
Kim, M. [4 ]
Merritt, C. D. [3 ]
Meyer, J. R. [3 ]
机构
[1] Maxion Technol Inc, College Pk, MD 20740 USA
[2] SUNY Stony Brook, Stony Brook, NY 11790 USA
[3] U S Naval Res Lab, Washington, DC 98020 USA
[4] Sotera Def Solut Inc, Herndon, VA 78746 USA
来源
NOVEL IN-PLANE SEMICONDUCTOR LASERS XI | 2012年 / 8277卷
关键词
Interband Cascade Lasers; Mid-IR Lasers; Semiconductor Lasers; Infrared Countermeasures; Chemical Sensing; Free-Space Communications; ROOM-TEMPERATURE;
D O I
10.1117/12.910586
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An interband cascade laser design has been grown by molecular beam epitaxy using uncracked arsenic and antimony sources. Lasers were fabricated into both broad-area and narrow-ridge devices, with cavity lengths ranging between 1 mm and 4 mm. At 300K, under low-duty-cycle pulsed conditions, threshold current densities for lasers with 2-mm cavity lengths are as low as 395 A/cm(2), with optical emission centered at a wavelength of similar to 3.82 mu m at 300 K. Continuous-wave (cw) performance of the narrow-ridge devices has been achieved for temperatures up to almost 60 degrees C. We present results of both pulsed (broad-area and ridge) and cw (ridge only) measurements on these lasers, including L-I-V, spectral, cavity-length, and Hakki-Paoli analyses.
引用
收藏
页数:12
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