Study of flaws inspection in ceramics materials using UT and X-Ray methods

被引：1

作者：

Nishimura, Yoshihiro ^{[1
]}

Suzuki, Takayuki ^{[1
]}

Kondo, Naoki ^{[2
]}

Kita, Hideki ^{[2
]}

Hirao, Kiyoshi ^{[2
]}

机构：

[1] AIST, Adv Mfg Res Inst, Tsukuba, Ibaraki 3058564, Japan

[2] Adv Mfg Res Inst, Nagoya, Aichi, Japan

来源：

INTERNATIONAL JOURNAL OF APPLIED ELECTROMAGNETICS AND MECHANICS | 2012年 / 39卷 / 1-4期

关键词：

Silicon nitride; flaws; ultrasound; X-Ray/CT;

D O I：

10.3233/JAE-2012-1490

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The possibility of inspecting flaws in ceramic materials using Ultrasonic Testing (UT) and X-Ray methods was studied to investigate the reliability of ceramic material joints. First, Scanning Electron Microscope (SEM) images of two grades of ceramics were compared to those acquired by a scanning acoustic microscope (SAM) with respect to the number, and size of flaws. Second, ceramic sample with a known size of internal voids was evaluated by X-Ray-CT. Third, two jointed ceramic specimens were evaluated by X-Ray methods, SAM, and other UT methods. X-Ray methods and UT methods effectively established the safety of ceramic materials for structural uses.

引用

页码：413 / 418

页数：6