Study of flaws inspection in ceramics materials using UT and X-Ray methods

被引:1
作者
Nishimura, Yoshihiro [1 ]
Suzuki, Takayuki [1 ]
Kondo, Naoki [2 ]
Kita, Hideki [2 ]
Hirao, Kiyoshi [2 ]
机构
[1] AIST, Adv Mfg Res Inst, Tsukuba, Ibaraki 3058564, Japan
[2] Adv Mfg Res Inst, Nagoya, Aichi, Japan
关键词
Silicon nitride; flaws; ultrasound; X-Ray/CT;
D O I
10.3233/JAE-2012-1490
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The possibility of inspecting flaws in ceramic materials using Ultrasonic Testing (UT) and X-Ray methods was studied to investigate the reliability of ceramic material joints. First, Scanning Electron Microscope (SEM) images of two grades of ceramics were compared to those acquired by a scanning acoustic microscope (SAM) with respect to the number, and size of flaws. Second, ceramic sample with a known size of internal voids was evaluated by X-Ray-CT. Third, two jointed ceramic specimens were evaluated by X-Ray methods, SAM, and other UT methods. X-Ray methods and UT methods effectively established the safety of ceramic materials for structural uses.
引用
收藏
页码:413 / 418
页数:6
相关论文
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[2]  
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[3]  
Nishimura Y., 2010, 7 ANN C JSM OM JUL, P109